Electronic ionization induced atom migration in spinel MgAl 2O4

Journal of Nuclear Materials

Volumn 403, Issue 1-3, 2010, Pages 147-151

  Jiang, Nan ^a   Spence, John C H ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM MIGRATION; BONDING DISTANCES; ELECTRONIC IONIZATIONS; INITIAL STAGES; OCTAHEDRAL INTERSTICES; ROOM TEMPERATURE; SPECTROSCOPIC EVIDENCE; STRUCTURAL FRAMEWORKS; TIME-DEPENDENT;

ALUMINUM; ATOMIC SPECTROSCOPY; ELECTRON IRRADIATION; OXYGEN;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77955427177     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2010.06.013     Document Type: Article

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