Full recovery of electron damage in glass at ambient temperatures

Physical Review Letters

Volumn 96, Issue 20, 2006, Pages

  Mkhoyan, K A ^a   Silcox, J ^a   Ellison, A ^b   Ast, D ^c   Dieckmann, R ^c  

^a School of Operations Research and Industrial Engineering   (United States)

^b Corning Incorporated ^*  (United States)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; ELECTRON TRAPS; ENERGY DISSIPATION; GLASS; THERMODYNAMICS; THIN FILMS;

ELECTRON-BEAM-INDUCED DAMAGE; NANOSCALE MEASUREMENTS; THERMODYNAMIC ENERGY;

ELECTRON BEAMS;

EID: 33744496774     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.205506     Document Type: Article

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