Metallic phase formation in oxide films

Journal of Non-Crystalline Solids

Volumn 354, Issue 12-13, 2008, Pages 1256-1262

  Wang, Paul W ^a   Hsu, Jin Cherng ^b   Hwa, Luu Gen ^b  

^a BRADLEY UNIVERSITY   (United States)

^b FU JEN CATHOLIC UNIVERSITY   (Taiwan)

Author keywords

Atomic force and scanning tunneling microscopy; Diffusion and transport; Oxide glasses; Radiation; Radiation effects; Thermal properties; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION; HEAT TREATMENT; METALLIC FILMS; OPTICAL PROPERTIES; RADIATION EFFECTS; SCANNING TUNNELING MICROSCOPY; THERMODYNAMIC PROPERTIES; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY REDUCTION; OXIDE GLASSES; PHASE FORMATION;

OXIDE FILMS;

EID: 38649139928     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.10.080     Document Type: Article

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