A technique for improved focused ion beam milling of cryo-prepared life science specimens

Journal of Microscopy

Volumn 226, Issue 3, 2007, Pages 263-269

  Hayles, M F ^a   Stokes, D J ^a,b   Phifer, D ^a   Findlay, K C ^c  

^a Thermo Fisher Scientific   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c NORWICH RESEARCH PARK   (United Kingdom)

Author keywords

Cryo; FIB; Gas injector system (GIS); Life sciences; SEM

Indexed keywords

DEPOSITION; FOCUSED ION BEAMS; IONS;

CRYO; FIB; FOCUSED ION BEAM MILLING; FOCUSED IONS BEAMS; GAS INJECTOR SYSTEM; GAS INJECTORS; ION SCANNING; LIFE-SCIENCES; LOWS-TEMPERATURES; TRANSFER SYSTEMS;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; BIOMEDICINE; CRYOPRESERVATION; IMAGE ANALYSIS; NONHUMAN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TECHNIQUE; TOBACCO;

EID: 34347396814     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01775.x     Document Type: Article

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