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Volumn , Issue , 2013, Pages

Fault tolerance for multi-threaded applications by leveraging hardware transactional memory

Author keywords

Error detection; Error recovery; HTM; Redundancy

Indexed keywords

FAULT DETECTION SCHEMES; HARDWARE TRANSACTIONAL MEMORY; HTM; MISSION CRITICAL APPLICATIONS; MULTI- THREADED APPLICATIONS; MULTI-THREADED APPLICATION; PERFORMANCE DEGRADATION; TRANSIENT AND PERMANENT FAULT;

EID: 84879509439     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2482767.2482773     Document Type: Conference Paper
Times cited : (13)

References (30)
  • 3
    • 0024053977 scopus 로고
    • An approach to crosstalk effect analysis and avoidance techniques in digital CMOS VLSI circuits
    • R. Anglada and A. Rubio. An Approach to Crosstalk Effect Analysis and Avoidance Techniques in Digital CMOS VLSI Circuits. International Journal of Electronics, 6(5):9-17, 1988.
    • (1988) International Journal of Electronics , vol.6 , Issue.5 , pp. 9-17
    • Anglada, R.1    Rubio, A.2
  • 4
    • 21244491597 scopus 로고    scopus 로고
    • Soft errors in advanced computer systems
    • R. Baumann. Soft Errors in Advanced Computer Systems. IEEE Design and Test of Computers, 22(3):258-266, 2005.
    • (2005) IEEE Design and Test of Computers , vol.22 , Issue.3 , pp. 258-266
    • Baumann, R.1
  • 12
    • 58349113422 scopus 로고    scopus 로고
    • Transient fault recovery on chip multiprocessor based on dual core redundancy and context saving
    • R. Gong, K. Dai, and Z. Wang. Transient Fault Recovery on Chip Multiprocessor based on Dual Core Redundancy and Context Saving. International Conference for Young Computer Scientists, pages 148-153, 2008.
    • (2008) International Conference for Young Computer Scientists , pp. 148-153
    • Gong, R.1    Dai, K.2    Wang, Z.3
  • 16
  • 18
  • 21
    • 0032667728 scopus 로고    scopus 로고
    • IBM's S/390 G5 microprocessor design
    • T. J. Slegel and et al. IBM's S/390 G5 Microprocessor Design. IEEE Micro, 19:12-23, 1999.
    • (1999) IEEE Micro , vol.19 , pp. 12-23
    • Slegel, T.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.