X-ray photoelectron spectroscopy (XPS) and diffraction (XPD) study of a few layers of graphene on 6H-SiC(0001)

Surface Science

Volumn 615, Issue , 2013, Pages 47-56

  Ferrah, D ^a   Penuelas, J ^a   Bottela, C ^a   Grenet, G ^a   Ouerghi, A ^b  

^a ECOLE CENTRALE DE LYON   (France)

^b CNRS   (France)

Author keywords

6H SiC; Graphene; Oxygen intercalation; X ray photoelectron diffraction

Indexed keywords

6H-SIC; CRYSTALLOGRAPHIC INFORMATION; GRAPHENE SHEETS; GRAPHITE-LIKE STRUCTURES; OXYGEN INTERCALATION; POINT OF VIEWS; X RAY PHOTO-ELECTRON DIFFRACTION;

DIFFRACTION; GRAPHENE; GRAPHITE; OXYGEN; PHOTOELECTRONS; PHOTONS; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

SILICON CARBIDE;

EID: 84878805774     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2013.04.006     Document Type: Article

References (53)

1. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, M.I. Katsnelson, I.V. Grigorieva, S.V. Dubonos, and A.A. Firsov Nature 43 2005 197
2. A.H. Castro Neto, F. Guinea, N.M.R. Peres, K.S. Novoselov, and A.K. Geim Rev. Mod. Phys. 81 2009 109
3. I.W. Frank, D.M. Tanenbaum, A.M. van der Zande, and P.L. McEuen J. Vac. Sci. Technol. B 25 2007 2558
4. F. Bonaccorso, Z. Sun, T. Hasan, and A.C. Ferrari Nat. Photonics 4 2010 611
5. V. Ilyasov, B. Meshi, A. Ryzhkin, I. Ershov, I. Nikiforov, and A. Ilyasov J. Mod. Phys. 2 2011 1120
6. S.V. Morozov, K.S. Novoselov, M.I. Katsnelson, F. Schedin, D. Elias, J.A. Jaszczak, and A.K. Geim Phys. Rev. Lett. 100 2008 016602
7. S. Das Sarma, S. Adam, E.H. Hwang, and E. Rossi Rev. Mod. Phys. 83 2011 407
8. Y. Zhang, Y.-W. Tan, H.L. Stormer, and P. Kim Nature 438 2005 201
9. J.F. Tia, L.A. Jauregui, G. Lopez, H. Cao, and Y.P. Chen Appl. Phys. Lett. 96 2010 263110
10. A. Candini, S. Klyatskaya, M. Ruben, W. Wernsdorfer, and M. Affronte Nano Lett. 11 2011 2634
11. C. Soldano, A. Mahmood, and E. Dujardin Carbon 48 2010 2127
12. K.S. Novoselov, A.K. Geim, S.V. Morozov, D. Jiang, Y. Zhang, S.V. Dubonos, I.V. Grigorieva, and A.A. Firsov Science 306 2004 666
13. C. Berger, Z. Song, T. Li, X. Li, A.Y. Ogbazghi, R. Feng, Z. Dai, A.N. Marchenkov, E.H. Conrad, P.N. First, and W.A. de Heer J. Phys. Chem. B 108 2004 19912
14. J. Hass, R. Feng, J.E. Millan-Otoya, X. Li, M. Sprinkle, P.N. First, W.A. de Heer, E.H. Conrad, and C. Berger Phys. Rev. B 75 2007 214109
15. J. Wintterlin, and M.-L. Bocquet Surf. Sci. 603 2009 1841
16. S. Park, and R. Ruoff Nat. Nanotechnol. 4 2009 217
17. A. Ouerghi, R. Belkhou, M. Marangolo, M.G. Silly, S. El Moussaoui, M. Eddrief, L. Largeau, M. Portail, and F. Sirotti Appl. Phys. Lett. 97 2010 161905
18. C. Virojanadara, A.A. Zakharov, R. Yakimova, and L.I. Johansson Surf. Sci. 604 2010 L4
19. A. Ouerghi, A. Balan, C. Castelli, M. Picher, R. Belkhou, M. Eddrief, M.G. Silly, M. Marangolo, A. Shukla, and F. Sirotti Appl. Phys. Lett. 101 2012 021603
20. A. Ouerghi, A. Kahouli, D. Lucot, M. Portail, L. Travers, J. Gierak, J. Penuelas, P. Jegou, A. Shukla, T. Chassagne, and M. Zielinski Appl. Phys. Lett. 96 2010 191910
21. A. Ouerghi, M. Ridene, A. Balan, R. Belkhou, A. Barbier, N. Gogneau, M. Portail, A. Michon, S. Latil, P. Jegou, and A. Shukla Phys. Rev. B 83 2011 205429
22. J. Hass, W.A. de Heer, and E.H. Conrad J. Phys. Condens. Matter 20 2008 323202
23. Luxmi, N. Srivastava, Guowei He, R.M. Feenstra, and P.J. Fisher Phys. Rev. B 8 2 2010 235406
24. G. Gu, S. Nie, R.M. Feenstra, R.P. Devaty, W.J. Choyke, W.K. Chan, and M.G. Kane Appl. Phys. Lett. 90 2007 253507
25. J.B. Hannon, and R.M. Tromp Phys. Rev. B 77 2008 241404
26. G.F. Sun, Y. Liu, S.H. Rhim, J.F. Jia, Q.K. Xue, M. Weinert, and L. Li Phys. Rev. B 84 2011 195455
27. D.A. Siegel, S.Y. Zhou, F. El Gabaly, A.K. Schmid, K.F. McCarty, and A. Lanzara Phys. Rev. B 80 2009 241407
28. H. Hibino, S. Mizuno, H. Kageshima, M. Nagase, and H. Yamaguchi Phys. Rev. B 80 2009 085406
29. L.B. Biedermann, M.L. Bolen, M.A. Capano, D. Zemlyanov, and R.G. Reifenberger Phys. Rev. B 79 2009 125411
30. U. Starke, and C. Riedl J. Phys. Condens. Matter 21 2009 134016
31. J.-Y. Veuillen, F. Hiebel, L. Magaud, P. Mallet, and Varchon J. Phys. D: Appl. Phys. 43 2010
32. F. Varchon, P. Mallet, J.-Y. Veuillen, and L. Magaud Phys. Rev. B 77 2008 235412
33. G.F. Sun, J.F. Jia, Q.K. Xue, and L. Li Nanotechnology 20 2009 355701
34. H.-G. Jee, K.-H. Jin, J.-H. Han, H.-N. Hwang, S.-H. Jhi, Y.-D. Kim, and C.-C. Hwang Phys. Rev. B 84 2011 075457
35. C. Riedl, C. Coletti, T. Iwasaki, A.A. Zakharov, and U. Starke Phys. Rev. Lett. 103 2009 246804
36. C. Xia, S. Watcharinyanon, A.A. Zakharov, R. Yakimova, L. Hultman, L.I. Johansson, and C. Virojanadara Phys. Rev. B 85 2012 045418
37. L.H. de Lima, A. de Servio, R. Landers, G.A. Viana, A.M.B. Goncalves, R.G. Lacerda, and P. Haberle Phys. Rev. B 87 2013 081403
38. C. Riedl, U. Starke, J. Bernhardt, M. Franke, and K. Heinz Phys. Rev. B 76 2007 245406
39. K.V. Emtsev, F. Speck, Th. Seyller, and L. Ley Phys. Rev. B 77 2008 155303
40. G. Sclauzero, and A. Pasquarello Phys. Rev. B 85 2012 161405(R)
41. F.J. Ferrer, E. Moreau, D. Vignaud, D. Deresmes, S. Godey, and X. Wallart J. Appl. Phys. 109 2011 054307
42. J. Penuelas, A. Ouerghi, D. Lucot, C. David, J. Gierak, H. Estrade - Szwarckopf, and C. Andreazza -Vignolle Phys. Rev. B 79 2009 033408
43. P.R. Wallace Phys. Rev. 71 1947 622
44. C.S. Fadley Prog. Surf. Sci. 16 1984 275
45. T. Ohta, A. Bostwick, J.L. McChesney, T. Seyller, K. Horn, and E. Rotenberg Phys. Rev. Lett. 98 2007 206802
46. W. Norimatsu, and M. Kusunoki Phys. Rev. B 81 2010 161410R
47. L. Simon, J.L. Bischoff, and L. Kubler Phys. Rev. B 60 1999 11653
48. O.M. Kuttel, R.G. Agostino, R. Fasel, J. Osterwalder, and L. Schlapbach Surf. Sci. 312 1994 131
49. B. Hornetz, H.-J. Michel, and J. Halbritter J. Vac. Sci. Technol. A 13 1995 767
50. C. Virojanadara, S. Watcharinyanon, A.A. Zakharov, and L.I. Johansson Phys Rev. B 82 2010 205402
51. C. Xia, S. Watcharinyanon, A.A. Zakharov, R. Yakimova, L. Hultman, L.I. Johansson, and C. Virojanadara Phys. Rev. B 85 2012 045418
52. C. Riedl, C. Coletti, T. Iwasaki, A.A. Zakharov, and U. Starke Phys. Rev. Lett. 103 2009 246804
53. C. Riedl, C. Coletti, and U. Starke J. Phys. D: Appl. Phys. 43 2010 374009