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Volumn 79, Issue 3, 2009, Pages

Surface morphology and characterization of thin graphene films on SiC vicinal substrate

Author keywords

[No Author keywords available]

Indexed keywords


EID: 60349104063     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.033408     Document Type: Article
Times cited : (82)

References (25)
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    • 10.1103/PhysRevLett.81.4460
    • T. Mélin and F. Laruelle, Phys. Rev. Lett. 81, 4460 (1998). 10.1103/PhysRevLett.81.4460
    • (1998) Phys. Rev. Lett. , vol.81 , pp. 4460
    • Mélin, T.1    Laruelle, F.2
  • 11
    • 0000014708 scopus 로고
    • 2nd ed., edited by D. Briggs and P. M. Seah (Wiley, New York
    • P. M. A. Sherwood, in Practical Surface Analysis, 2nd ed., edited by, D. Briggs, and, P. M. Seah, (Wiley, New York, 1990), pp. 572-575.
    • (1990) Practical Surface Analysis , pp. 572-575
    • Sherwood, P.M.A.1
  • 17
    • 60349118023 scopus 로고    scopus 로고
    • Asymmetry parameter values of 0, 0.03, and 0.1 were found to produce best fits to the spectra recorded from, respectively, the B, G, and S peaks.
    • Asymmetry parameter values of 0, 0.03, and 0.1 were found to produce best fits to the spectra recorded from, respectively, the B, G, and S peaks.
  • 24
    • 46049088779 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.77.241404;
    • J. B. Hannon and R. M. Tromp, Phys. Rev. B 77, 241404 (R) (2008) 10.1103/PhysRevB.77.241404
    • (2008) Phys. Rev. B , vol.77 , pp. 241404
    • Hannon, J.B.1    Tromp, R.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.