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Volumn 535, Issue 1, 2013, Pages 366-370

Defect level signatures in CuInSe2 by photocurrent and capacitance spectroscopy

Author keywords

Capacitance spectroscopy; CIGSe; Defect levels; Meyer Neldel; PICTS; Solar cells

Indexed keywords

CAPACITANCE SPECTROSCOPY; CIGSE; DEFECT LEVELS; MEYER-NELDEL; PICTS;

EID: 84878191335     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.12.084     Document Type: Conference Paper
Times cited : (18)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.