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Volumn 5, Issue 10, 2013, Pages 4490-4494
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Performance improvement of resistive switching memory achieved by enhancing local-electric-field near electromigrated Ag-nanoclusters
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELDS;
NANOCLUSTERS;
OXYGEN;
OXYGEN VACANCIES;
ZINC OXIDE;
CONDUCTING FILAMENT;
DEVICE PERFORMANCE;
PERFORMANCE IMPROVEMENTS;
RECOMBINATION RATE;
RESISTIVE SWITCHING MEMORY;
SIMPLE STRUCTURES;
SURFACE CURVATURES;
SWITCHING PARAMETERS;
SWITCHING;
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EID: 84877769253
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c3nr33692a Document Type: Article |
Times cited : (109)
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References (22)
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