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Volumn 100, Issue 13, 2012, Pages

Analysis of efficiency droop in nitride light-emitting diodes by the reduced effective volume of InGaN active material

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE MATERIAL; ACTIVE REGIONS; ACTIVE VOLUMES; AUGER RECOMBINATION; CARRIER DISTRIBUTIONS; CARRIER LOCALIZATION; CARRIER RATE EQUATION; DROOP CHARACTERISTICS; EFFECTIVE VOLUME; INGAN QUANTUM WELLS;

EID: 84859540207     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3698113     Document Type: Article
Times cited : (111)

References (28)
  • 1
    • 77957891166 scopus 로고    scopus 로고
    • 10.1002/pssa.201026149
    • J. Piprek, Phys. Status Solidi A 207, 2217 (2010). 10.1002/pssa.201026149
    • (2010) Phys. Status Solidi A , vol.207 , pp. 2217
    • Piprek, J.1
  • 6
    • 35648955103 scopus 로고    scopus 로고
    • Defect related issues in the "current roll-off" in InGaN based light emitting diodes
    • DOI 10.1063/1.2801704
    • B. Monemar and B. E. Sernelius, Appl. Phys. Lett. 91, 181103 (2007). 10.1063/1.2801704 (Pubitemid 350037159)
    • (2007) Applied Physics Letters , vol.91 , Issue.18 , pp. 181103
    • Monemar, B.1    Sernelius, B.E.2
  • 12
    • 28344433167 scopus 로고    scopus 로고
    • Near-field scanning optical microscopic transient lens for carrier dynamics study in InGaNGaN
    • DOI 10.1063/1.2105999, 161104
    • K. Okamoto, A. Scherer, and Y. Kawakami, Appl. Phys. Lett. 87, 161104 (2005). 10.1063/1.2105999 (Pubitemid 41717033)
    • (2005) Applied Physics Letters , vol.87 , Issue.16 , pp. 1-3
    • Okamoto, K.1    Scherer, A.2    Kawakami, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.