Analog fault diagnosis using S-transform preprocessor and a QNN classifier

Measurement: Journal of the International Measurement Confederation

Volumn 46, Issue 7, 2013, Pages 2174-2183

  Tan, Yanghong ^a   Sun, Yichuang ^b   Yin, Xin ^a  

^a HUNAN UNIVERSITY   (China)

^b UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

Analog fault diagnosis; Mixed signal test; Quantum neural network; S transform

Indexed keywords

NEURAL NETWORKS;

ANALOG FAULT DIAGNOSIS; COMPUTATIONAL TOOLS; FAULT DIAGNOSTIC SYSTEMS; FREQUENCY-DEPENDENT; FUZZY CLASSIFICATION; MIXED-SIGNAL TEST; QUANTUM NEURAL NETWORKS; S TRANSFORMS;

UNCERTAINTY ANALYSIS;

EID: 84877013474     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2013.03.002     Document Type: Article

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