A novel linear ridgelet network approach for analog fault diagnosis using wavelet-based fractal analysis and kernel PCA as preprocessors

Measurement: Journal of the International Measurement Confederation

Volumn 45, Issue 3, 2012, Pages 297-310

  Xiao, Yingqun ^a   Feng, Lianggui ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

Analog circuits; Fault diagnosis; Kernel PCA; Linear ridgelet network; Wavelet based fractal analysis

Indexed keywords

ANALOG FAULT DIAGNOSIS; CLASSIFICATION RATES; DIAGNOSTIC SYSTEMS; FRACTAL ANALYSIS; HIDDEN NEURONS; INPUT NODE; KERNEL PCA; KERNEL PRINCIPAL COMPONENT; MULTIPLE FAULTS; PREPROCESS; PROCESSING TIME; RESPONSE SIGNAL; RIDGELETS; TIME RESPONSE; WAVELET-BASED FRACTAL ANALYSIS;

ANALOG CIRCUITS; FAILURE ANALYSIS; FRACTALS; NETWORKS (CIRCUITS); PRINCIPAL COMPONENT ANALYSIS;

NEURAL NETWORKS;

EID: 84856713392     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2011.11.018     Document Type: Article

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