-
1
-
-
0029748739
-
Automatic analog fault simulation
-
H. Spence, "Automatic analog fault simulation," in Proc. AUTOTESTCON Conf., 1996, pp. 17-22.
-
(1996)
Proc. AUTOTESTCON Conf
, pp. 17-22
-
-
Spence, H.1
-
3
-
-
0031094371
-
Linear circuit fault diagnosis using neuromorphic analyzer
-
Mar
-
R. Spina and S. Upadhyaya, "Linear circuit fault diagnosis using neuromorphic analyzer," IEEE Trans. Circuits Syst. II, vol. 44, no. 3, pp. 188-196, Mar. 1997.
-
(1997)
IEEE Trans. Circuits Syst. II
, vol.44
, Issue.3
, pp. 188-196
-
-
Spina, R.1
Upadhyaya, S.2
-
5
-
-
0022107260
-
Fault diagnosis of analog circuits
-
Aug
-
J. W. Bandler and A. Salama, "Fault diagnosis of analog circuits," Proc. IEEE, vol. 73, no. 8, pp. 1279-1325, Aug. 1985.
-
(1985)
Proc. IEEE
, vol.73
, Issue.8
, pp. 1279-1325
-
-
Bandler, J.W.1
Salama, A.2
-
6
-
-
0030079923
-
On the application of neural networks to fault diagnosis of electronic analog circuits
-
Feb
-
M. Catelani and M. Gori, "On the application of neural networks to fault diagnosis of electronic analog circuits," Measurement, vol. 17, no. 2, pp. 73-80, Feb. 1996.
-
(1996)
Measurement
, vol.17
, Issue.2
, pp. 73-80
-
-
Catelani, M.1
Gori, M.2
-
7
-
-
0033897037
-
Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor
-
Feb
-
M. Aminian and F. Aminian, "Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor," IEEE Trans. Circuits Syst. II, vol. 47, no. 2, pp. 151-156, Feb. 2000.
-
(2000)
IEEE Trans. Circuits Syst. II
, vol.47
, Issue.2
, pp. 151-156
-
-
Aminian, M.1
Aminian, F.2
-
8
-
-
0035244599
-
Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor
-
Feb
-
F. Aminian and M. Aminian, "Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor," J. Electron. Test.: Theory Appl., vol. 17, no. 1, pp. 29-36, Feb. 2001.
-
(2001)
J. Electron. Test.: Theory Appl
, vol.17
, Issue.1
, pp. 29-36
-
-
Aminian, F.1
Aminian, M.2
-
9
-
-
0035678439
-
Fault diagnosis of nonlinear circuits using neural networks with wavelet and Fourier transforms as preprocessors
-
F. Aminian and M. Aminian, "Fault diagnosis of nonlinear circuits using neural networks with wavelet and Fourier transforms as preprocessors," J. Electron. Test.: Theory Appl., vol. 17, pp. 471-481, 2001.
-
(2001)
J. Electron. Test.: Theory Appl
, vol.17
, pp. 471-481
-
-
Aminian, F.1
Aminian, M.2
-
10
-
-
0036612713
-
Analog fault diagnosis of actual circuits using neural networks
-
Jun
-
F. Aminian, M. Aminian, and B. Collins, "Analog fault diagnosis of actual circuits using neural networks," IEEE Trans. Instrum. Meas. vol. 51, no. 3, pp. 544-550, Jun. 2002.
-
(2002)
IEEE Trans. Instrum. Meas
, vol.51
, Issue.3
, pp. 544-550
-
-
Aminian, F.1
Aminian, M.2
Collins, B.3
-
16
-
-
0029703070
-
Wavelet GRI-MINACE filter for rotation-invariant pattern recognition
-
H. W. Lee, "Wavelet GRI-MINACE filter for rotation-invariant pattern recognition," SPIE, vol. 2762, pp. 343-352, 1994.
-
(1994)
SPIE
, vol.2762
, pp. 343-352
-
-
Lee, H.W.1
-
17
-
-
0025438295
-
Testability analysis of analog systems
-
Jun
-
G. J. Hemink, B. W. Meijer, and H. G. Kerkhoff, "Testability analysis of analog systems," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 9, no. 6, pp. 573-583, Jun. 1990.
-
(1990)
IEEE Trans. Comput.-Aided Design Integr. Circuits Syst
, vol.9
, Issue.6
, pp. 573-583
-
-
Hemink, G.J.1
Meijer, B.W.2
Kerkhoff, H.G.3
-
18
-
-
0004259250
-
-
E. Fiesler and R. Beale, Eds, London, U.K, Oxford Univ. Press
-
E. Fiesler and R. Beale, Eds., Handbook of Neural Computation. London, U.K.: Oxford Univ. Press, 1997.
-
(1997)
Handbook of Neural Computation
-
-
-
20
-
-
0032299866
-
New approach for the fault diagnosis of linear analog networks
-
1, C4010
-
M. R. Rizk and M. Y. Yacout, "New approach for the fault diagnosis of linear analog networks," in Proc. NRSC, 1998, pp. C40(1) -C40(10).
-
(1998)
Proc. NRSC
-
-
Rizk, M.R.1
Yacout, M.Y.2
-
21
-
-
0033321308
-
Analog circuit fault diagnosis based on noise measurement
-
Aug
-
Y. Dai and J. Xu, "Analog circuit fault diagnosis based on noise measurement," Microelectron. Reliab., vol. 39, no. 8, pp. 1293-1298, Aug. 1999.
-
(1999)
Microelectron. Reliab
, vol.39
, Issue.8
, pp. 1293-1298
-
-
Dai, Y.1
Xu, J.2
-
22
-
-
0031358941
-
Neural fault diagnosis techniques for nonlinear analogue circuits
-
K. Madani, A. Bengharbi, and V. Amarger, "Neural fault diagnosis techniques for nonlinear analogue circuits," SPIE, vol. 3077, no. 3, pp. 491-502, 1997.
-
(1997)
SPIE
, vol.3077
, Issue.3
, pp. 491-502
-
-
Madani, K.1
Bengharbi, A.2
Amarger, V.3
-
23
-
-
0035248405
-
Closing the gap between analog and digital testing
-
Feb
-
K. Saab, N. B. Hamida, and B. Kaminska, "Closing the gap between analog and digital testing," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 20, no. 2, pp. 307-314, Feb. 2001.
-
(2001)
IEEE Trans. Comput.-Aided Design Integr. Circuits Syst
, vol.20
, Issue.2
, pp. 307-314
-
-
Saab, K.1
Hamida, N.B.2
Kaminska, B.3
|