Wavelet neural network approach for fault diagnosis of analogue circuits

IEE Proceedings: Circuits, Devices and Systems

Volumn 151, Issue 4, 2004, Pages 379-384

  He, Y ^a   Tan, Y ^a   Sun, Y ^b  

^a HUNAN UNIVERSITY   (China)

^b UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; AUTOMATIC TESTING; COMPUTER SIMULATION; FEATURE EXTRACTION; MONTE CARLO METHODS; NEURAL NETWORKS; PRINCIPAL COMPONENT ANALYSIS; RELIABILITY; SPURIOUS SIGNAL NOISE; WAVELET TRANSFORMS;

ANALOG CIRCUITS; FAULT DIAGNOSIS; WAVELET DECOMPOSITION;

ACTIVE FILTERS;

EID: 5044243210     PISSN: 13502409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cds:20040495     Document Type: Article

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