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Volumn , Issue , 2008, Pages 1-390
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Test and diagnosis of analogue, mixed-signal and RF integrated circuits: The system on chip approach
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Author keywords
Analogue integrated circuits; Automatic SoC testing; Automatic testing; Fault diagnosis; Integrated circuit testing; Mixed analogue digital integrated circuits; Mixed signal integrated circuits; RF integrated circuits; Single chip transceiver; System on chip; Systems on chip
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Indexed keywords
ANALOG INTEGRATED CIRCUITS;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
AUTOMATIC TESTING;
DIGITAL INTEGRATED CIRCUITS;
FAILURE ANALYSIS;
FAULT DETECTION;
INTEGRATED CIRCUIT TESTING;
PROGRAMMABLE LOGIC CONTROLLERS;
STUDENTS;
SYSTEM-ON-CHIP;
TIMING CIRCUITS;
FUNDAMENTAL CONCEPTS;
FUTURE RESEARCH DIRECTIONS;
MIXED-SIGNAL TESTING;
RF INTEGRATED CIRCUITS;
SINGLE-CHIP TRANSCEIVERS;
SOC TESTING;
SYSTEMS ON CHIPS;
UNDERGRADUATE STUDENTS;
MIXED SIGNAL INTEGRATED CIRCUITS;
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EID: 85013483818
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1049/PBCS019E Document Type: Book |
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Times cited : (21)
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References (0)
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