A novel approach of analog circuit fault diagnosis using support vector machines classifier

Measurement: Journal of the International Measurement Confederation

Volumn 44, Issue 1, 2011, Pages 281-289

  Cui, Jiang ^a   Wang, Youren ^a  

^a NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

Author keywords

Analog circuits; Fault diagnosis; Label analysis; Space distance discriminant analysis; Support vector machines classifier

Indexed keywords

ACTUAL EXPERIMENTS; ANALYSIS METHOD; CIRCUIT FAULTS; CIRCUIT UNDER TEST; DATA ACQUISITION CARDS; DIAGNOSIS PERFORMANCE; DIGITAL SIGNAL PROCESSOR SYSTEMS; FAULT CLASSIFIER; FAULT DIAGNOSIS; FAULT DICTIONARY; IMPROVED SUPPORT VECTOR MACHINE; OUTPUT RESPONSE; PREPROCESSING TECHNIQUES; SIMPLE METHOD; SPACE DISTANCE; SUPPORT VECTOR; TEST TIME;

CLASSIFIERS; DIAGNOSIS; DIGITAL SIGNAL PROCESSORS; DISCRIMINANT ANALYSIS; SIGNAL PROCESSING; SUPPORT VECTOR MACHINES; VECTOR SPACES; VECTORS;

ANALOG CIRCUITS;

EID: 78650012085     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2010.10.004     Document Type: Article

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