A global parametric faults diagnosis with the use of artificial neural networks

ECCTD 2009 - European Conference on Circuit Theory and Design Conference Program

Volumn , Issue , 2009, Pages 651-654

  Jantos, Piotr ^a   Grzechca, Damian ^a   Rutkowski, Jerzy ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOGUE INTEGRATED CIRCUITS; ARTIFICIAL NEURAL NETWORK; CIRCUIT STATE; CIRCUIT UNDER TEST; DIAGNOSIS METHODS; FIRST ORDER DERIVATIVES; OPERATION AMPLIFIER; PARAMETRIC FAULT; TEST TIME; VOLTAGE STEP;

BACKPROPAGATION; BANDPASS FILTERS; CIRCUIT THEORY; INTEGRATED CIRCUITS; LINEAR INTEGRATED CIRCUITS; TIME DOMAIN ANALYSIS;

NEURAL NETWORKS;

EID: 71249137720     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCTD.2009.5275063     Document Type: Conference Paper

References (11)

1. P. Kabisatpathy and A. Barula and S. Sinha, Fault Diagnosis in Anaologue Integrated Circuits, Springer, 2005
2. K. R. Laker and W. M. C. Sansen, Design of Analog Integrated Circuits and Systems, MacGraw - Hill, 1994
3. T. Ytterdal and Y. Cheng and T. Fjeldly, Device Modeling for Analog and RF CMOS Circuit Design, Wiley, 2003
4. P. van Zant, Microchip Fabrication: A Practical Guide to Semiconductor Processing, McGraw-Hill, 2004
5. P. Jantos and D. Grzechca and T. Golonek and J. Rutkowski, The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features, 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems,DDEC08, 2008, pp. 299-303
6. P. Jantos and D. Grzechca and T. Golonek and J. Rutkowski, Global Parametric Faults in Analogue Electronic Integrated Circuits: Two Approaches to Classification with the Use of Differential Evolution, The 2nd European Computing Conference, ECC'08, sponsored by WSEAS, New Aspects on Computing Research, WSEAS Press, Malta, v.1., pp. 281-286
7. M. A. Arbib, The Handbook of Brain Theory and Neural Networks, The MIT Press, 2003
8. J. A. Freeman and D. M. Skapura, Neural Networks: Algorithms, Applications and Programming Techniques, Addison-Wesley Publishing Company, 1991
9. S. Chakrabarti and S. Cherubal and A. Chatterjee, Fault diagnosis for mixed-signal electronic systems, Aerospace Conference 1999, Proceedings 1999 IEEE, Volume 3, pp. 169-179
10. S. Cherubal and A. Chatterjee, Test generation based diagnosis of device parameters for analog circuits, DATE '01: Proceedings of the conference on Design, automation and test in Europe, pp. 596-602
11. S. Chakrabarti and A. Chatterjee, Compact Fault Dictionary Construction for Efficient Isolation of Faults in Analog and Mixed-Signal Circuits, Proceedings of the 20th Anniversary Conference on Advanced Research in VLSI (ARVLSI '99), pp. 327-341