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Volumn , Issue , 2009, Pages 555-558

Multidimensional search space for catastrophic faults diagnosis in analog electronic circuits

Author keywords

Catastrophic faults; Multidimensional search space; Particle swarm algorithm; Tester

Indexed keywords

ANALOG CIRCUIT DIAGNOSIS; ANALOG ELECTRONIC CIRCUIT; CATASTROPHIC FAULT; CIRCUIT UNDER TEST; FAULT DIAGNOSIS; HARDWARE SOLUTIONS; INPUT VARIABLES; LOAD RESISTANCES; MULTIDIMENSIONAL SEARCH; NEW APPROACHES; NEW DIMENSIONS; ONE DIMENSION; PARTICLE SWARM ALGORITHM; SEARCH SPACES; TESTING STRATEGIES;

EID: 71249094334     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECCTD.2009.5275037     Document Type: Conference Paper
Times cited : (7)

References (6)
  • 2
    • 71249145505 scopus 로고    scopus 로고
    • Russell C. Eberhart, Yuhui Shi Swarm Intelligence, Morgan Kaufmann; 1 edition (Mar 26 2001)
    • Russell C. Eberhart, Yuhui Shi "Swarm Intelligence," Morgan Kaufmann; 1 edition (Mar 26 2001)
  • 4
    • 71249150627 scopus 로고    scopus 로고
    • Mar 05
    • www.clerc.maurice.free.fr/pso/ , (Mar 05 2009)
    • (2009)
  • 6
    • 2942598802 scopus 로고    scopus 로고
    • Entropy-Based optimum Test Point Selection for Analog Fault Dictionary Techniques
    • June
    • Starzyk J.A. et all, "Entropy-Based optimum Test Point Selection for Analog Fault Dictionary Techniques", IEEE Transaction on Instrumentation and Measurement, Vol. 53, no 3, pp.754-761, June 2004
    • (2004) IEEE Transaction on Instrumentation and Measurement , vol.53 , Issue.3 , pp. 754-761
    • Starzyk, J.A.1    et all2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.