A SVDD approach of fuzzy classification for analog circuit fault diagnosis with FWT as preprocessor

Expert Systems with Applications

Volumn 38, Issue 8, 2011, Pages 10554-10561

  Luo, Hui ^a   Jiang Cui, Youren Wang ^a  

^a NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

Author keywords

Analog circuit; Fault diagnosis; Feature extraction; Fractional wavelet transform; KFCM; SVDD

Indexed keywords

CIRCUIT FAULTS; CLUSTER CENTERS; FAULT DIAGNOSIS; FAULT FEATURE; FAULT SAMPLE; FRACTIONAL ORDER; FRACTIONAL WAVELET TRANSFORMS; FUZZY C MEAN; FUZZY CLASSIFICATION; FUZZY REGION; FWT ALGORITHM; HYPER-SPHERES; KERNEL MATRICES; KFCM; LOCAL FAULTS; MULTI-CLASSIFIER; NEW APPROACHES; PREPROCESS; PREPROCESSORS; RELATIVE DISTANCES; SIMULATION RESULT; SUPPORT VECTOR DATA DESCRIPTION; SVDD;

CLUSTERING ALGORITHMS; FEATURE EXTRACTION; FUZZY SETS; METADATA; WAVELET TRANSFORMS;

ANALOG CIRCUITS;

EID: 79953676840     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2011.02.087     Document Type: Article

References (34)

1. F. Amimian, and M. Aminian Fault diagnosis of analog circuits using bayesian neural networks with wavelet transform as preprocessor Journal of Electronic Testing: Theory and Applications 17 1 2001 29 36 (Pubitemid 32638808)
2. F. Amimian, and M. Aminian Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and fourier transforms as preprocessors Journal of Electronic Testing: Theory and Applications 17 6 2001 471 481 (Pubitemid 34050902)
3. L.H. Bao, L.F. Chen, and D.M. Zhao Optical encryption with cascaded fractional wavelet transforms Journal of Zhejiang University Science A of China 7 8 2006 1431 1435
4. B. Billur, and A. Birsel Fractional fourier transform pre-processing for neural networks and its application to object recognition Neural Networks 15 1 2002 131 140
5. H.G. Bu, J. Wang, and B.H. Xiu Fabric defect detection based on multiple fractal features and support vector data description Engineering Applications of Artificial Intelligence 22 2 2009 224 235
6. L.F. Chen, and D.M. Zhao Optical Image Encryption based on fractional wavelet transform Optics Communications 254 4-6 2005 361 367
7. L.F. Chen, and D.M. Zhao Image encryption with fractional wavelet packet method Optik 119 6 2008 286 291
8. G. Francesco, L. Antonio, M. Stefano, and C.P. Maria A method for the automatic selection of test frequencies in analog fault diagnosis IEEE Transactions on Instrumentation and Measurement 56 6 2007 2322 2329
9. T. Golonek, and J. Rutkowski Genetic algorithm based method for optimal analog test points selection IEEE Transactions on Circuits and Systems II: Express Briefs 54 2 2007 117 121 (Pubitemid 46477674)
10. Y. Huang The fractional wave packet transform Multidimensional Systems and Signal Processing 4 9 1998 399 402 (Pubitemid 128511645)
11. M.M. Jordi, B. Lorenzo, and C.V. Gustavo A support vector domain description approach to supervised classification of remote sensing images IEEE Transactions on Geoscience and Remote Sensing 45 8 2007 2683 2692
12. P. Kabisatpathy, A. Barua, and S. Sinha Fault diagnosis of analog integrated circuits 2005 Springer Verlag Berlin
13. W.S. Kang, and J.Y. Choi Domain density description for multiclass pattern classification with reduced computational load Pattern Recognition 41 6 2008 1997 2009
14. K. Lee, D.W. Kim, D. Lee, and K.H. Lee Improving support vector data description using local density degree Pattern Recognition 38 10 2005 1768 1771 (Pubitemid 41037109)
15. K.Y. Lee, D.W. Kim, K.H. Lee, and D. Lee Density-induced support vector data description IEEE Transactions on Neural Networks 18 1 2007 284 289 (Pubitemid 46062933)
16. D. Lee, and D. Lee Domain described support vector classifier for multi-classification problems Pattern Recognition 40 1 2007 41 51 (Pubitemid 44486292)
17. S.W. Lee, J. Park, and S.W. Lee Low resolution face recognition based on support vector data description Pattern Recognition 39 9 2006 1809 1812 (Pubitemid 43867581)
18. Y.H. Liu, S.H. Lin, and Y.L. Hsueh Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble Expert Systems with Applications 36 2 Part 1 2008 1978 1998
19. E.G. Ma Genetically evolved neural networks for fault classification in analog circuits Neural Computing and Applications 11 2 2002 112 121
20. D. Mendlovic, Z. Zalevsky, D. Mas, J. García, and C. Ferreira Fractional wavelet transform Applied Optics 36 20 1997 4801 4806 (Pubitemid 127615615)
21. H.M. Ozaktas, and O. Aytür Fractional fourier domains Signal Processing 46 1 1995 119 124
22. S.C. Pei, M.H. Yeh, and C.C. Tseng Discrete fractional fourier transform based on orthogonal projections IEEE Transaction on Signal Processing 47 5 1999 1335 1347
23. S.N. Sharma, R. Saxena, and S.C. Saxena Tuning of FIR filter transition bandwidth using fractional fourier transform Signal Processing 87 12 2007 3147 3154 (Pubitemid 47263479)
24. J.A. Starzyk, D. Liu, Z.H. Liu, D.E. Nelson, and J.O. Rutkowski Entropy-based optimum test points selection for analog fault dictionary techniques IEEE Transactions on Instrumentation and Measurement 53 3 2004 754 761
25. V. Stopjaková, P. Malošek, D. Mičušík, M. Matej, and M. Margala Classification of defective analog integrated circuits using artificial neural networks Journal of Electronic Testing: Theory and Applications 20 1 2004 25 37
26. Y.H. Tan, Y.G. He, C. Cui, and G.Y. Qiu A novel method for analog fault diagnosis based on neural networks and genetic algorithms IEEE Transactions on Instrumentation and Measurement 57 11 2008 2631 2639
27. R. Tao, B. Deng, and Y. Wang progress of the fractional fourier transform in signal processing Science in China: Series F Information Sciences 49 1 2006 1 25 (Pubitemid 44598410)
28. D. Tax, and R. Duin Support vector domain description Pattern Recognition Letter 20 11-13 1999 1191 1199 (Pubitemid 32261897)
29. D. Tax, and R. Duin Support vector data description Machine Learning 54 1 2004 45 66
30. D. Tax, and P. Juszczak Kernel whitening for one-class classification International Journal of Pattern Recognition and Artificial Intelligence 17 3 2003 333 347
31. V.N. Vapnik The nature of statistical learning theory 2000 Springer New York
32. Z.R. Yang, M. Zwolinski, C.D. Chalk, and A.C. Williams Applying a robust heteroscedastic probabilistic neural network to analog fault detection and classification IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 19 1 2000 142 151 (Pubitemid 30557240)
33. D.Q. Zhang, and S.C. Chen Clustering incomplete data using kernel-dased fuzzy C-means algorithm Neural Processing Letters 18 3 2003 155 162
34. Y. Zhang, X.D. Liu, and F.D. Xie Fault classifier of rotating machinery based on weighted support vector data description Expert Systems with Applications 36 4 2009 7928 7932