SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 102, Issue 12, 2013, Pages

Quasi-reversible point defect relaxation in amorphous In-Ga-Zn-O thin films by in situ electrical measurements

(5) Adler, Alexander U a Yeh, Ted C a Bruce Buchholz, D a Chang, Robert P H a Mason, Thomas O a

a Northwestern University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS OXIDES; CHARGED OXYGEN VACANCIES; DEFECT RELAXATION; ELECTRICAL MEASUREMENT; ELECTRICAL PROPERTY MEASUREMENT; OXYGEN EXCHANGE; OXYGEN PARTIAL PRESSURE; TIME INDEPENDENTS;

GALLIUM; POINT DEFECTS; THIN FILMS; ZINC;

ELECTRIC PROPERTIES;

EID: 84875914670 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4796119 Document Type: Article

Times cited : (13)

References (32)

1
- 9744248669
- 10.1038/nature03090
- K. Nomura, H. Ohta, A. Takagi, T. Kamiya, M. Hirano, and H. Hosono, Nature 432, 488-492 (2004). 10.1038/nature03090
- (2004) Nature , vol.432 , pp. 488-492
- Nomura, K.¹ Ohta, H.² Takagi, A.³ Kamiya, T.⁴ Hirano, M.⁵ Hosono, H.⁶

2
- 33745435681
- 10.1016/j.jnoncrysol.2006.01.073
- H. Hosono, J. Non-Cryst. Solids 352, 851-858 (2006). 10.1016/j. jnoncrysol.2006.01.073
- (2006) J. Non-Cryst. Solids , vol.352 , pp. 851-858
- Hosono, H.¹

3
- 34548454544
- 10.1063/1.2773952
- D. Kang, I. Song, C. Kim, Y. Park, T. D. Kang, H. S. Lee, J.-W. Park, S. H. Baek, S.-H. Choi, and H. Lee, Appl. Phys. Lett. 91, 091910 (2007). 10.1063/1.2773952
- (2007) Appl. Phys. Lett. , vol.91 , pp. 091910
- Kang, D.¹ Song, I.² Kim, C.³ Park, Y.⁴ Kang, T.D.⁵ Lee, H.S.⁶ Park, J.-W.⁷ Baek, S.H.⁸ Choi, S.-H.⁹ Lee, H.¹⁰

4
- 34250646701
- 10.1063/1.2749177
- T. Iwasaki, N. Itagaki, T. Den, H. Kumomi, K. Nomura, T. Kamiya, and H. Hosono, Appl. Phys. Lett. 90, 242114 (2007). 10.1063/1.2749177
- (2007) Appl. Phys. Lett. , vol.90 , pp. 242114
- Iwasaki, T.¹ Itagaki, N.² Den, T.³ Kumomi, H.⁴ Nomura, K.⁵ Kamiya, T.⁶ Hosono, H.⁷

5
- 13544269370
- 10.1063/1.1843286
- H. Q. Chiang, J. F. Wager, R. L. Hoffman, J. Jeong, and D. A. Keszler, Appl. Phys. Lett. 86, 013503 (2005). 10.1063/1.1843286
- (2005) Appl. Phys. Lett. , vol.86 , pp. 013503
- Chiang, H.Q.¹ Wager, J.F.² Hoffman, R.L.³ Jeong, J.⁴ Keszler, D.A.⁵

6
- 27644464403
- 10.1063/1.2120895
- W. B. Jackson, R. L. Hoffman, and G. S. Herman, Appl. Phys. Lett. 87, 193503 (2005). 10.1063/1.2120895
- (2005) Appl. Phys. Lett. , vol.87 , pp. 193503
- Jackson, W.B.¹ Hoffman, R.L.² Herman, G.S.³

7
- 43049106869
- 10.1149/1.2903866
- K. J. Saji, M. K. Jayaraj, K. Nomura, T. Kamiya, and H. Hosono, J. Electrochem. Soc. 155, H390-H395 (2008). 10.1149/1.2903866
- (2008) J. Electrochem. Soc. , vol.155
- Saji, K.J.¹ Jayaraj, M.K.² Nomura, K.³ Kamiya, T.⁴ Hosono, H.⁵

8
- 69249184461
- 10.1063/1.3206948.
- M. K. Ryu, S. Yang, S. H. Ko Park, C. S. Hwang, and J. K. Jeong, Appl. Phys. Lett. 95, 072104 (2009) 10.1063/1.3206948.
- (2009) Appl. Phys. Lett. , vol.95 , pp. 072104
- Ryu, M.K.¹ Yang, S.² Ko Park, S.H.³ Hwang, C.S.⁴ Jeong, J.K.⁵

9
- 77956070963
- 10.1021/ja9103155
- J. Liu, D. B. Buchholz, J. W. Hennek, R. P. H. Chang, A. Facchetti, and T. J. Marks, J. Am. Chem. Soc. 132, 11934-11942 (2010). 10.1021/ja9103155
- (2010) J. Am. Chem. Soc. , vol.132 , pp. 11934-11942
- Liu, J.¹ Buchholz, D.B.² Hennek, J.W.³ Chang, R.P.H.⁴ Facchetti, A.⁵ Marks, T.J.⁶

10
- 44849134063
- 10.1063/1.2937473
- E. M. C. Fortunato, L. M. N. Pereira, P. M. C. Barquinha, A. M. Botelho do Rego, G. Gonçalves, A. Vilà, J. R. Morante, and R. F. P. Martins, Appl. Phys. Lett. 92, 222103 (2008). 10.1063/1.2937473
- (2008) Appl. Phys. Lett. , vol.92 , pp. 222103
- Fortunato, E.M.C.¹ Pereira, L.M.N.² Barquinha, P.M.C.³ Botelho Do Rego, A.M.⁴ Gonçalves, G.⁵ Vilà, A.⁶ Morante, J.R.⁷ Martins, R.F.P.⁸

11
- 54249108024
- 10.1002/pssa.200778908
- Y. Ogo, K. Nomura, H. Yanagi, T. Kamiya, M. Hirano, and H. Hosono, Physica Status Solidi A 205, 1920-1924 (2008). 10.1002/pssa.200778908
- (2008) Physica Status Solidi A , vol.205 , pp. 1920-1924
- Ogo, Y.¹ Nomura, K.² Yanagi, H.³ Kamiya, T.⁴ Hirano, M.⁵ Hosono, H.⁶

12
- 73449096392
- 10.1063/1.3275801.
- C. J. Kim, S. Kim, J.-H. Lee, J.-S. Park, S. Kim, J. Park, E. Lee, J. Lee, Y. Park, J. H. Joo Kim, S. T. Shin, and U.-In. Chung, Appl. Phys. Lett. 95, 252103 (2009) 10.1063/1.3275801.
- (2009) Appl. Phys. Lett. , vol.95 , pp. 252103
- Kim, C.J.¹ Kim, S.² Lee, J.-H.³ Park, J.-S.⁴ Kim, S.⁵ Park, J.⁶ Lee, E.⁷ Lee, J.⁸ Park, Y.⁹ Joo Kim, J.H.¹⁰ Shin, S.T.¹¹ Chung, U.-In.¹²

13
- 78149382528
- 10.1088/1468-6996/11/4/044305.
- T. Kamiya and K. Nomura, Sci. Technol. Adv. Mater. 11, 044305 (2010) 10.1088/1468-6996/11/4/044305.
- (2010) Sci. Technol. Adv. Mater. , vol.11 , pp. 044305
- Kamiya, T.¹ Nomura, K.²

14
- 78149439156
- 10.1038/asiamat.2010.5
- T. Kamiya and H. Hosono, NPG Asia Mater. 2, 15-22 (2010). 10.1038/asiamat.2010.5
- (2010) NPG Asia Mater. , vol.2 , pp. 15-22
- Kamiya, T.¹ Hosono, H.²

15
- 84861829395
- 10.1002/adma.201103228
- E. Fortunato, P. Barquinha, and R. Martins, Adv. Mater. 24, 2945-2986 (2012). 10.1002/adma.201103228
- (2012) Adv. Mater. , vol.24 , pp. 2945-2986
- Fortunato, E.¹ Barquinha, P.² Martins, R.³

16
- 84855965812
- 10.1016/j.tsf.2011.07.018
- J. S. Park, W.-J. Maeng, H.-S. Kim, and J.-S. Park, Thin Solid Films 520, 1679-1693 (2012). 10.1016/j.tsf.2011.07.018
- (2012) Thin Solid Films , vol.520 , pp. 1679-1693
- Park, J.S.¹ Maeng, W.-J.² Kim, H.-S.³ Park, J.-S.⁴

17
- 0003838850
- G. Brouwer, Philips Res. Rep. 9, 366-376 (1954).
- (1954) Philips Res. Rep. , vol.9 , pp. 366-376
- Brouwer, G.¹

18
- 84855507333
- 10.1103/PhysRevLett.108.016802
- S. Lany, A. Zakutayev, T. Mason, J. Wager, K. Poeppelmeier, J. Perkins, J. Berry, D. Ginley, and A. Zunger, Phys. Rev. Lett. 108, 016802 (2012). 10.1103/PhysRevLett.108.016802
- (2012) Phys. Rev. Lett. , vol.108 , pp. 016802
- Lany, S.¹ Zakutayev, A.² Mason, T.³ Wager, J.⁴ Poeppelmeier, K.⁵ Perkins, J.⁶ Berry, J.⁷ Ginley, D.⁸ Zunger, A.⁹

19
- 84874030487
- 10.1063/1.4790187.
- S. Lee and D. C. Paine, Appl. Phys. Lett. 102, 052101 (2013) 10.1063/1.4790187.
- (2013) Appl. Phys. Lett. , vol.102 , pp. 052101
- Lee, S.¹ Paine, D.C.²

20
- 84861742428
- 10.1063/1.3699372
- K. Ide, K. Nomura, H. Hiramatsu, T. Kamiya, and H. Hosono, J. Appl. Phys. 111, 073513 (2012). 10.1063/1.3699372
- (2012) J. Appl. Phys. , vol.111 , pp. 073513
- Ide, K.¹ Nomura, K.² Hiramatsu, H.³ Kamiya, T.⁴ Hosono, H.⁵

21
- 84875961972
- Ph.D. dissertation, Technischen Universität Darmstadt.
- C. Köerber, Ph.D. dissertation, Technischen Universität Darmstadt, 2010.
- (2010)
- Köerber, C.¹

22
- 84864276859
- 10.1016/j.snb.2012.06.057.
- D. J. Yang, G. C. Whitfield, N. G. Cho, P.-S. Cho, I.-D. Kim, H. Saltsburg, and H. L. Tuller, Sens. Actuators B 171, 1166-1171 (2012) 10.1016/j.snb.2012.06.057.
- (2012) Sens. Actuators B , vol.171 , pp. 1166-1171
- Yang, D.J.¹ Whitfield, G.C.² Cho, N.G.³ Cho, P.-S.⁴ Kim, I.-D.⁵ Saltsburg, H.⁶ Tuller, H.L.⁷

23
- 0035875755
- 10.1016/S0925-4005(01)00694-3
- B. Kamp, R. Merkle, and J. Maier, Sens. Actuators B 77, 534-542 (2001). 10.1016/S0925-4005(01)00694-3
- (2001) Sens. Actuators B , vol.77 , pp. 534-542
- Kamp, B.¹ Merkle, R.² Maier, J.³

24
- 25444441242
- 10.1016/j.jssc.2005.07.019
- B. Kamp, R. Merkle, R. Lauck, and J. Maier, J. Solid State Chem. 178, 3027-3039 (2005). 10.1016/j.jssc.2005.07.019
- (2005) J. Solid State Chem. , vol.178 , pp. 3027-3039
- Kamp, B.¹ Merkle, R.² Lauck, R.³ Maier, J.⁴

25
- 84875958368
- red vs. time.
- red vs. time.

26
- 77954735967
- 10.1149/1.3460302
- D. H. Lee, K.-i. Kawamura, K. Nomura, T. Kamiya, and H. Hosono, Electrochem. Solid-State Lett. 13, H324 (2010). 10.1149/1.3460302
- (2010) Electrochem. Solid-State Lett. , vol.13 , pp. 324
- Lee, D.H.¹ Kawamura, K.I.² Nomura, K.³ Kamiya, T.⁴ Hosono, H.⁵

27
- 84875960971
- Ph.D. dissertation, Northwestern University.
- A. U. Adler, Ph.D. dissertation, Northwestern University, 2013.
- (2013)
- Adler, A.U.¹

28
- 84870863634
- 10.1063/1.4764924
- E. M. Hopper, H. Peng, S. A. Hawks, A. J. Freeman, and T. O. Mason, J. Appl. Phys. 112, 093712 (2012). 10.1063/1.4764924
- (2012) J. Appl. Phys. , vol.112 , pp. 093712
- Hopper, E.M.¹ Peng, H.² Hawks, S.A.³ Freeman, A.J.⁴ Mason, T.O.⁵

29
- 33846374741
- 10.1103/PhysRevB.75.035212
- K. Nomura, T. Kamiya, H. Ohta, T. Uruga, M. Hirano, and H. Hosono, Phys. Rev. B 75, 035212 (2007). 10.1103/PhysRevB.75.035212
- (2007) Phys. Rev. B , vol.75 , pp. 035212
- Nomura, K.¹ Kamiya, T.² Ohta, H.³ Uruga, T.⁴ Hirano, M.⁵ Hosono, H.⁶

30
- 41649084966
- 10.1063/1.2904704
- M. Kimura, T. Nakanishi, K. Nomura, T. Kamiya, and H. Hosono, Appl. Phys. Lett. 92, 133512 (2008). 10.1063/1.2904704
- (2008) Appl. Phys. Lett. , vol.92 , pp. 133512
- Kimura, M.¹ Nakanishi, T.² Nomura, K.³ Kamiya, T.⁴ Hosono, H.⁵

31
- 41649120938
- 10.1063/1.2857463
- H.-H. Hsieh, T. Kamiya, K. Nomura, H. Hosono, and C.-C. Wu, Appl. Phys. Lett. 92, 133503 (2008). 10.1063/1.2857463
- (2008) Appl. Phys. Lett. , vol.92 , pp. 133503
- Hsieh, H.-H.¹ Kamiya, T.² Nomura, K.³ Hosono, H.⁴ Wu, C.-C.⁵

32
- 44349136836
- 10.1063/1.2927306
- K. Nomura, T. Kamiya, H. Yanagi, E. Ikenaga, K. Yang, K. Kobayashi, M. Hirano, and H. Hosono, Appl. Phys. Lett. 92, 202117 (2008). 10.1063/1.2927306
- (2008) Appl. Phys. Lett. , vol.92 , pp. 202117
- Nomura, K.¹ Kamiya, T.² Yanagi, H.³ Ikenaga, E.⁴ Yang, K.⁵ Kobayashi, K.⁶ Hirano, M.⁷ Hosono, H.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.