A compact 45 kV curve tracer with picoampere current measurement capability

Review of Scientific Instruments

Volumn 84, Issue 3, 2013, Pages

  Sullivan, W W ^a   Mauch, D ^a   Bullick, A ^a   Hettler, C ^a   Neuber, A ^a   Dickens, J ^a  

^a Texas Tech University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCKING PERFORMANCE; CONTROL SOFTWARE; DC CONDITIONS; DEVICE UNDER TEST; HIGH VOLTAGE SEMICONDUCTOR DEVICES; PHOTOCONDUCTIVE SEMICONDUCTOR SWITCHES; REAL TIME MEASUREMENTS; UNIVERSAL SERIAL BUS INTERFACES;

CERAMIC CAPACITORS; PHOTOCONDUCTIVE SWITCHES; SILICON CARBIDE; STANDARDS;

ELECTRICITY;

EID: 84875789455     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4794734     Document Type: Article

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