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Volumn , Issue , 2009, Pages 271-274

Design and investigation of frequency capability of 15kV 4H-SiC IGBT

Author keywords

[No Author keywords available]

Indexed keywords

AS DOPING; BUFFER REGION; CURRENT ENHANCEMENT LAYERS; DRIFT REGIONS; FORWARD VOLTAGE DROPS; FREQUENCY CAPABILITY; N-CHANNEL; POWER MOSFETS; POWER-LOSSES; SUBSTRATE DOPING; SWITCHING POWER LOSS;

EID: 77949985350     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2009.5158054     Document Type: Conference Paper
Times cited : (40)

References (10)
  • 2
    • 34547774599 scopus 로고    scopus 로고
    • High Voltage Self-Aligned pchannel DMOS-IGBTs in 4H-SiC
    • Y.Sui, X. Wang, J.A. Cooper, "High Voltage Self-Aligned pchannel DMOS-IGBTs in 4H-SiC," IEEE Electron Device Lett., 28, 728-730 (2007)
    • (2007) IEEE Electron Device Lett , vol.28 , pp. 728-730
    • Sui, Y.1    Wang, X.2    Cooper, J.A.3
  • 4
    • 49249118798 scopus 로고    scopus 로고
    • Optimization of on-state and switching performance for 15-20 kV 4H-SiC IGBTs
    • Sep
    • T. Tamaki, G. G. Walden, Y. Sui, and J. A. Cooper, "Optimization of on-state and switching performance for 15-20 kV 4H-SiC IGBTs," IEEE Trans. On Electron Devices, vol. 55, no. 8, pp.1920-1927, Sep. 2008.
    • (2008) IEEE Trans. On Electron Devices , vol.55 , Issue.8 , pp. 1920-1927
    • Tamaki, T.1    Walden, G.G.2    Sui, Y.3    Cooper, J.A.4
  • 6
    • 0009509593 scopus 로고
    • Carrier mobilities in Silicon empirically related to doping and field
    • Dec
    • M. Caughey and R. E. Thomas, "Carrier mobilities in Silicon empirically related to doping and field," Proc. IEEE, pp. 2192-2193, Dec. 1967.
    • (1967) Proc. IEEE , pp. 2192-2193
    • Caughey, M.1    Thomas, R.E.2
  • 7
    • 0028732473 scopus 로고    scopus 로고
    • W.J. Schaffer, et al, Conductivity Anisotropy in Epitaxial 6H and 4H SiC, MRS. Symp. Proc. Vol339, pp595-600, 1994
    • W.J. Schaffer, et al, "Conductivity Anisotropy in Epitaxial 6H and 4H SiC," MRS. Symp. Proc. Vol339, pp595-600, 1994
  • 8
    • 33646108114 scopus 로고    scopus 로고
    • Temperature Dependence of Current Gain in Power 4H-SiC NPN BJTs
    • Ivanov, et al, "Temperature Dependence of Current Gain in Power 4H-SiC NPN BJTs," IEEE Trans. On Electron Devices, vol.53, pp.1245-1249, 2006
    • (2006) IEEE Trans. On Electron Devices , vol.53 , pp. 1245-1249
    • Ivanov1
  • 10
    • 0000038064 scopus 로고    scopus 로고
    • Study of Avalanche Breakdown and Impact Ionization in 4H Silicon Carbide
    • A. O. Konstantinov, Q. Wahab, N. Nordell and U. Lindefelt, "Study of Avalanche Breakdown and Impact Ionization in 4H Silicon Carbide," Journal of Electronic Materials, Vol. 27, No. 4, 1998, pp. 335-341.
    • (1998) Journal of Electronic Materials , vol.27 , Issue.4 , pp. 335-341
    • Konstantinov, A.O.1    Wahab, Q.2    Nordell, N.3    Lindefelt, U.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.