메뉴 건너뛰기




Volumn 6, Issue 3, 2013, Pages 191-199

Fast and reliable identification of atomically thin layers of TaSe2 crystals

Author keywords

atomically thin layer; layered superconductor; metal dichalcogenide; optical microscopy; Raman spectroscopy

Indexed keywords


EID: 84874939903     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-013-0295-9     Document Type: Article
Times cited : (69)

References (48)
  • 3
    • 33846295541 scopus 로고    scopus 로고
    • Realization and electrical characterization of ultrathin crystals of layered transition-metal dichalcogenides
    • Ayari, A.; Cobas, E.; Ogundadegbe, O.; Fuhrer, M. S. Realization and electrical characterization of ultrathin crystals of layered transition-metal dichalcogenides. J. Appl. Phys. 2007, 101, 014507.
    • (2007) J. Appl. Phys. , vol.101 , pp. 014507
    • Ayari, A.1    Cobas, E.2    Ogundadegbe, O.3    Fuhrer, M.S.4
  • 7
    • 76449109164 scopus 로고    scopus 로고
    • Atomically-thin crystalline films and ribbons of bismuth telluride
    • Teweldebrhan, D.; Goyal, V.; Rahman, M.; Balandin, A. A. Atomically-thin crystalline films and ribbons of bismuth telluride. Appl. Phys. Lett. 2010, 96, 053107.
    • (2010) Appl. Phys. Lett. , vol.96 , pp. 053107
    • Teweldebrhan, D.1    Goyal, V.2    Rahman, M.3    Balandin, A.A.4
  • 17
    • 81255169387 scopus 로고    scopus 로고
    • Single-layer semiconducting nanosheets: High-yield preparation and device fabrication
    • Zeng, Z. Y.; Yin, Z. Y.; Huang, X.; Li, H.; He, Q. Y.; Lu, G.; Boey, F.; Zhang, H. Single-layer semiconducting nanosheets: High-yield preparation and device fabrication. Angew. Chem. Int. Ed. 2011, 50, 11093-11097.
    • (2011) Angew. Chem. Int. Ed. , vol.50 , pp. 11093-11097
    • Zeng, Z.Y.1    Yin, Z.Y.2    Huang, X.3    Li, H.4    He, Q.Y.5    Lu, G.6    Boey, F.7    Zhang, H.8
  • 31
    • 49349095015 scopus 로고    scopus 로고
    • Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
    • Nemes-Incze, P.; Osváth, Z.; Kamarás, K.; Biró, L. P. Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy. Carbon2008, 46, 1435-1442.
    • (2008) Carbon , vol.46 , pp. 1435-1442
    • Nemes-Incze, P.1    Osváth, Z.2    Kamarás, K.3    Biró, L.P.4
  • 32
    • 84859148918 scopus 로고    scopus 로고
    • Calibration of piezoelectric positioning actuators using a reference voltage-to-displacement transducer based on quartz tuning forks
    • Castellanos-Gomez, A.; Arroyo, C. R.; Agraït, N.; Rubio-Bollinger, G. Calibration of piezoelectric positioning actuators using a reference voltage-to-displacement transducer based on quartz tuning forks. Microsc. Microanal. 2012, 18, 353-358.
    • (2012) Microsc. Microanal. , vol.18 , pp. 353-358
    • Castellanos-Gomez, A.1    Arroyo, C.R.2    Agraït, N.3    Rubio-Bollinger, G.4
  • 35
    • 10444254709 scopus 로고    scopus 로고
    • Improvement to reflective dielectric film color pictures
    • Kvavle, J.; Bell, C.; Henrie, J.; Schultz, S.; Hawkins, A. Improvement to reflective dielectric film color pictures. Opt. Express2004, 12, 5789-5794.
    • (2004) Opt. Express , vol.12 , pp. 5789-5794
    • Kvavle, J.1    Bell, C.2    Henrie, J.3    Schultz, S.4    Hawkins, A.5
  • 37
    • 0343866453 scopus 로고
    • The reflectivity spectra of some group VA transition metal dichalcogenides
    • Beal, A. R.; Hughes, H. P.; Liang, W. Y. The reflectivity spectra of some group VA transition metal dichalcogenides. J. Phys. C Solid State Phys. 1975, 8, 4236.
    • (1975) J. Phys. C Solid State Phys. , vol.8 , pp. 4236
    • Beal, A.R.1    Hughes, H.P.2    Liang, W.Y.3
  • 38
    • 37049215553 scopus 로고
    • Human vision and the spectrum
    • Wald, G. Human vision and the spectrum. Science1945, 101, 653-658.
    • (1945) Science , vol.101 , pp. 653-658
    • Wald, G.1
  • 42
    • 77957204738 scopus 로고    scopus 로고
    • Atomically thin MoS2: A new direct-gap semiconductor
    • Mak, K. F.; Lee, C.; Hone, J.; Shan, J.; Heinz, T. F. Atomically thin MoS2: A new direct-gap semiconductor. Phys. Rev. Lett. 2010, 105, 136805.
    • (2010) Phys. Rev. Lett. , vol.105 , pp. 136805
    • Mak, K.F.1    Lee, C.2    Hone, J.3    Shan, J.4    Heinz, T.F.5
  • 44
    • 49349125551 scopus 로고
    • Raman spectroscopy of intercalated layered structure compounds
    • Tsang, J.; Shafer, M. Raman spectroscopy of intercalated layered structure compounds. Solid State Commun. 1978, 25, 999-1002.
    • (1978) Solid State Commun. , vol.25 , pp. 999-1002
    • Tsang, J.1    Shafer, M.2
  • 47
    • 79955836310 scopus 로고    scopus 로고
    • Reliably counting atomic planes of few-layer graphene (n & 4)
    • Koh, Y. K.; Bae, M. H.; Cahill, D. G.; Pop, E. Reliably counting atomic planes of few-layer graphene (n & 4). ACS Nano2011, 5, 269-274.
    • (2011) ACS Nano , vol.5 , pp. 269-274
    • Koh, Y.K.1    Bae, M.H.2    Cahill, D.G.3    Pop, E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.