Electron microscope verification of prebreakdown-inducing α-FeSi 2 needles in multicrystalline silicon solar cells

Journal of Applied Physics

Volumn 113, Issue 4, 2013, Pages

  Hahnel A ^a   Bauer, J ^a   Blumtritt, H ^a   Breitenstein, O ^a   Lausch, D ^b   Kwapil, W ^c  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b FRAUNHOFER CENTER FOR SILICON PHOTOVOLTAICS CSP   (Germany)

^c UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BREAKDOWN MECHANISM; DEFECT SITES; ELECTROLUMINESCENCE IMAGING; ELECTRON-BEAM-INDUCED CURRENT; IRON-CONTAINING; MONOCRYSTALLINE MATERIALS; MULTI-CRYSTALLINE SILICON SOLAR CELLS; MULTICRYSTALLINE; NANOBEAM ELECTRON DIFFRACTION; ORIENTATION RELATIONSHIP; PREFERENTIAL ORIENTATION; REVERSE-BIAS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SECONDARY ELECTRONS; SILICON MATRIX; TARGET PREPARATION; X-RAY MICROANALYSIS;

DEFECTS; ELECTRON BEAMS; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; NEEDLES; POLYSILICON; SPECIMEN PREPARATION; TRANSMISSION ELECTRON MICROSCOPY;

PRECIPITATES;

EID: 84873686604     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4779601     Document Type: Article

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