Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method

Ceramics International

Volumn 39, Issue 3, 2013, Pages 2185-2195

  Foschini, C R ^a   Ramirez, M A ^a   Simoes S R ^a   Varela, J A ^a   Longo, E ^a   Simoes A Z ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

A. Films; B. Interfaces; C. Dielectric properties; C. Ferroelectric properties

Indexed keywords

AMBIENT ATMOSPHERE; BFO FILMS; CHEMICAL COMPOSITIONS; CHEMICAL SOLUTION DEPOSITION TECHNIQUES; CRYSTALLINE PHASE; DOMAIN BEHAVIOR; DOMAIN FORMATION; DOMAIN SWITCHINGS; FERROELECTRIC PROPERTY; INSULATING PROPERTIES; LONGITUDINAL DIRECTION; MAGNETOELECTRIC COEFFICIENTS; MULTIFERROIC BEHAVIOR; NANO-METER SCALE; PIEZORESPONSE FORCE MICROSCOPY; PLATE-LIKE MORPHOLOGY; PT(111); RARE EARTH CATIONS; RARE EARTH DOPED; ROOM TEMPERATURE; SOFT CHEMICAL METHOD;

BISMUTH; BISMUTH COMPOUNDS; DIELECTRIC PROPERTIES; FERROELECTRIC FILMS; INTERFACES (MATERIALS); NEODYMIUM; PLATINUM; POSITIVE IONS; THIN FILMS;

LANTHANUM;

EID: 84872940486     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2012.08.083     Document Type: Review

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