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Journal of Materials Research

Volumn 16, Issue 5, 2001, Pages 1325-1332

Processing- and composition-dependent characteristics of chemical solution deposited Bi4-xLaxTi3O12 thin films

(6) Wu, Di a Li, Aidong a Zhu, Tao a Li, Zhifeng b Liu, Zhiguo a Ming, Naiben a

a NANJING UNIVERSITY (China)

b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; COMPOSITION EFFECTS; CRYSTAL STRUCTURE; CRYSTALLIZATION; DEPOSITION; FATIGUE TESTING; HYSTERESIS; LATTICE VIBRATIONS; MORPHOLOGY; POLARIZATION; RAMAN SPECTROSCOPY; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SURFACES; X RAY DIFFRACTION ANALYSIS;

CHEMICAL SOLUTION DEPOSTION;

THIN FILMS;

EID: 0035352089 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0185 Document Type: Article

Times cited : (97)

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