Ferroelectric characteristics of SrBi4Ti4O15 thin films grown on Pt/Ti/SiO2/Si substrates by the soft chemical method

Materials Letters

Volumn 60, Issue 16, 2006, Pages 2020-2023

  Simoes A Z ^a   Ramirez, M A ^a   Riccardi, C S ^a   Longo, E ^a   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

Atomic force microscopy; Dielectric properties; Fatigue; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; FATIGUE OF MATERIALS; FERROELECTRICITY; PEROVSKITE; POLYCRYSTALLINE MATERIALS; SILICON; STRONTIUM COMPOUNDS;

COERCIVE FIELD; POLYMERIC PRECURSOR; SOFT CHEMICAL METHOD;

THIN FILMS;

EID: 33646136447     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.12.071     Document Type: Article

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