Effects of annealing atmosphere on crystallization and electrical properties in BiFeO3 thin films by chemacal solution deposition (CSD)

Journal of the Korean Physical Society

Volumn 42, Issue SUPPL., 2003, Pages

  Yun, Kwi Young ^a   Noda, Minoru ^a   Okuyama, Masanori ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

AFM; Annealing atmosphere; BiFeO3 thin film; Hysteresis loop; Perovskite

Indexed keywords

EID: 0344723118     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (10)

1. Y. E. Roginskaya, Y. N. Venevtsev and G. S. Zhdanov, Sov. Phys. JEPT 21, 817 (1965).
2. G. A. Smolenskii and I. E. Chupis, Sov. Ptys. Usp. 25, 475 (1982).
3. S. A. Fedulov, Sov. Phys. Dokl. (English Transl.) 6, 729 (1962).
4. C. Michel, J. M. Moreau, G. D. Achenbach, R. Gerson and W. J. James, Solid State Commun. 7, 701 (1969).
5. S. Miyazawa, H. Iwasaki, J. Cryst. Growth. 10, 276 (1971).
6. J. D. Bucci, B. K. Robertson and W. J. James, J. Appl. Cryst. 5, 187 (1972).
7. A. J. Jacobson and B. E. F. Fender, J. Phys. C 8, 844 (1975).
8. J. R. Teague, R. Gerson and W. J. Tames, Solid State Commun. 8, 1073 (1970).
9. V. R. Palkar, J. John and R. Pinto, Appl. Phys. Lett. 80, 1628 (2002).
10. G. Teowee et al., Integrated Ferroelectrics. 18, 329 (1997).