Retention characteristics in Bi3.25La0.75Ti 3O12 thin films prepared by the polymeric precursor method

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Simoes A Z ^a   Ramirez, M A ^a   Perruci, N A ^a   Riccardi, C S ^a   Longo, E ^b   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CAPACITORS; CRYSTAL STRUCTURE; DIELECTRIC RELAXATION; ELECTRIC FIELDS; HEAT TREATMENT; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; X RAY DIFFRACTION;

DEPOLARIZATION FIELDS; POLYMERIC PRECURSOR METHODS; RETENTION CHARACTERISTICS; SWITCHABLE POLARIZATION;

FERROELECTRIC THIN FILMS;

EID: 17944376105     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1886893     Document Type: Article

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