Retro-fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operation

Journal of Microscopy

Volumn 249, Issue 2, 2013, Pages 87-92

  Borrnert F ^a   Bachmatiuk, A ^a   Gorantla, S ^a   Wolf, D ^b   Lubk, A ^b   Buchner B ^a   Rummeli M H ^a  

^a IFW DRESDEN   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Aberration correction; Retro fitting; STEM; TEM

Indexed keywords

ABERRATIONS; ACCELERATION; COST EFFECTIVENESS; LIGHT TRANSMISSION; SCANNING ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ABERRATION CORRECTORS; ACCELERATION VOLTAGES; BEAM DAMAGE; CONVENTIONAL IMAGING; ELECTRONS ACCELERATION; LIGHT MATERIALS; RETRO-FITTING; STEM; TEM;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

CARBON; GRAPHITE;

ARTICLE; BRIGHT FIELD MICROSCOPY; COST EFFECTIVENESS ANALYSIS; ELECTRIC POTENTIAL; ELECTRON; HOLOGRAPHY; ILLUMINATION; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84872766198     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2012.03684.x     Document Type: Article

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