Amorphous carbon under 80 kV electron irradiation: A means to make or break graphene

Advanced Materials

Volumn 24, Issue 41, 2012, Pages 5630-5635

  Börrnert, Felix ^a   Avdoshenko, Stanislav M ^b,c   Bachmatiuk, Alicja ^a   Ibrahim, Imad ^a,b   Büchner, Bernd ^a,b   Cuniberti, Gianaurelio ^b   Rümmeli, Mark H ^a,b  

^a IFW DRESDEN   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^c PURDUE UNIVERSITY   (United States)

Author keywords

amorphous carbon; electron irradiation; graphene; transmission electron microscopy

Indexed keywords

ACCELERATION VOLTAGES; CATALYST-FREE; GRAPHENE LAYERS; VAN DER WAALS INTERACTIONS;

AMORPHOUS CARBON; AUTOMOBILE MANUFACTURE; BORON NITRIDE; DEPOSITS; ELECTRON IRRADIATION; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES;

GRAPHENE;

CARBON; GRAPHITE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON; MOLECULAR DYNAMICS;

CARBON; CRYSTALLIZATION; ELECTRONS; GRAPHITE; MOLECULAR DYNAMICS SIMULATION;

EID: 84868118389     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201202173     Document Type: Article

References (22)

1. a) A. K. Geim, M. I. Katsnelson, K. S. Novoselov, T. J. Booth, S. Roth, Nature 2007, 446, 60
2. b) J. H. Warner, M. H. Rümmeli, L. Ge, T. Gemming, B. Montanari, N. M. Harrison, B. Büchner, G. A. D. Briggs, Nat. Nanotechnol. 2009, 4, 500
3. c) P. Y. Huang, C. S. Ruiz-Vargas, A. M. van der Zande, W. S. Whitney, M. P. Levendorf, J. W. Kevek, S. Garg, J. S. Alden, C. J. Hustedt, Y. Zhu, J. Park, P. L. McEuen, D. A. Muller, Nature 2011, 469, 389.
4. M. D. Fischbein, M. Drndić, Appl. Phys. Lett. 2008, 93, 113107.
5. F. Banhart, Rep. Prog. Phys. 1999, 62, 1181.
6. A. Yajima, S. Abe, T. Fuse, Y. Mera, K. Maeda, K. Suzuki, Mol. Cryst. Liq. Cryst. 2002, 388, 147.
7. K. Urban, A. Seeger, Philos. Mag. 1974, 30, 157.
8. a) R. F. Egerton, P. Li, M. Malac, Micron 2004, 35, 399
9. b) A. Zobelli, A. Gloter, C. P. Ewels, C. Colliex, Phys. Rev. B 2008, 77, 045410.
10. C. O. Girit, J. C. Meyer, R. Erni, M. D. Rossell, C. Kisielowski, L. Yang, C.-H. Park, M. F. Crommie, M. L. Cohen, S. G. Louie, A. Zettl, Science 2009, 323, 1705.
11. J. H. Warner, M. H. Rümmeli, T. Gemming, B. Büchner, G. A. D. Briggs, Nano Lett. 2009, 9, 102.
12. J. H. Warner, M. H. Rümmeli, A. Bachmatiuk, B. Büchner, ACS Nano 2010, 4, 1299.
13. D. Ugarte, Nature 1992, 359, 707.
14. V. E. Cosslett, J. Microsc. 1978, 113, 113.
15. A. Barreiro, F. Börrnert, S. M. Avdoshenko, B. Rellinghaus, G. Cuniberti, M. H. Rümmeli, L. M. K. Vandersypen, arXiv 2012, 1201. 3131.
16. A. V. Krasheninnikov, K. Nordlund, J. Appl. Phys. 2010, 107, 071301.
17. T. Yokota, M. Murayama, J. M. Howe, Phys. Rev. Lett. 2003, 91, 265504.
18. D. Porezag, T. Frauenheim, T. Köhler, G. Seifert, R. Kaschner, Phys. Rev. B 1995, 51, 12947.
19. CP2K. 2010 Software; http://www.cp2k.org/(last accessed: August 2012).
20. B. Dai, L. Fu, Z. Zou, M. Wang, H. Xu, S. Wang, Z. Liu, Nat. Commun. 2011, 2, 522.
21. D. B. Williams, C. B. Carter, Transmission Electron Microscopy, Plenum Press, New York/London 1996.
22. R. F. Egerton, F. Wang, P. A. Crozier, Microsc. Microanal. 2006, 12, 65.