Vertically segregated structure and properties of small molecule-polymer blend semiconductors for organic thin-film transistors

Advanced Functional Materials

Volumn 23, Issue 3, 2013, Pages 366-376

  Shin, Nayool ^a   Kang, Jihoon ^a   Richter, Lee J ^b   Prabhu, Vivek M ^b   Kline, R Joseph ^b   Fischer, Daniel A ^b   Delongchamp, Dean M ^b   Toney, Michael F ^c   Satija, Sushil K ^b   Gundlach, David J ^b   Purushothaman, Balaji ^d   Anthony, John E ^d   Yoon, Do Y ^a  

^a Seoul National University   (South Korea)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d UNIVERSITY OF KENTUCKY   (United States)

Author keywords

blend semiconductors; charge transport; organic thin film transistors; vertical phase segregation

Indexed keywords

ATACTIC; BLEND FILMS; COMPETING EFFECTS; COMPOSITION PROFILE; CRYSTALLINE ORDER; EXPERIMENTAL METHODS; GRAZING INCIDENCE X-RAY DIFFRACTION; INTERACTION ENERGIES; METHYLSTYRENE; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; NEUTRON REFLECTIVITY; ORGANIC SMALL MOLECULE; ORGANIC THIN FILM TRANSISTORS; PHASE SEGREGATIONS; POLYMER BINDERS; SIGNIFICANT IMPACTS; SMALL MOLECULES; SOLIDIFICATION KINETICS; SOLUTION-PROCESSED; STRUCTURE AND PERFORMANCE; STRUCTURE AND PROPERTIES; SUBSTRATE SURFACE; SYNDIOTACTIC POLYSTYRENES; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

BINDERS; CHARGE TRANSFER; CRYSTALLINE MATERIALS; ENTROPY; MOLECULES; ORGANIC POLYMERS; PHASE SEPARATION; POLYSTYRENES; SOLIDIFICATION; SPECTROSCOPIC ELLIPSOMETRY; THIN FILM TRANSISTORS; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION;

POLYMER FILMS;

EID: 84872320002     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201201389     Document Type: Article

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