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Volumn 133, Issue 3, 2011, Pages 412-415

Zone-refinement effect in small molecule-polymer blend semiconductors for organic thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

BLEND FILMS; CRITICAL CHARGE; CRYSTAL PHASE; FIELD-EFFECT MOBILITIES; HIGH TEMPERATURE; INSULATING POLYMER; INTERFACE REGIONS; METHYLSTYRENE; NEUTRON REFLECTIVITY; ORGANIC ELECTRONIC DEVICES; ORGANIC THIN FILM TRANSISTORS; PERFORMANCE CHARACTERISTICS; PROCESSABILITY; REFINEMENT EFFECTS; SEPARATED LAYER; SMALL MOLECULES; TIPS-PENTACENE; UNDERLYING MECHANISM; UV EXPOSURE;

EID: 79851481324     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja108772q     Document Type: Article
Times cited : (59)

References (21)
  • 21
    • 79851491596 scopus 로고    scopus 로고
    • Direct evidence for the removal of organic impurity from the bottom surface of a blend semiconductor film is obtained by the near-edge X-ray absorption fine structure spectroscopy study on a fluorine-substituted TESADT-PRMS blend film; see Figure S11 Supporting Information
    • Direct evidence for the removal of organic impurity from the bottom surface of a blend semiconductor film is obtained by the near-edge X-ray absorption fine structure spectroscopy study on a fluorine-substituted TESADT-PRMS blend film; see Figure S11, Supporting Information.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.