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Volumn 48, Issue 2, 2013, Pages 305-309

High photo-responsivity ZnO UV detectors fabricated by RF reactive sputtering

Author keywords

A. Semiconductors; A. Thin films; D. Electrical properties; D. Optical properties

Indexed keywords

FORWARD BIAS; HIGH QUALITY; IDEALITY FACTORS; IV CHARACTERISTICS; METAL SEMICONDUCTOR METAL; METAL-SEMICONDUCTOR CONTACTS; NIO THIN FILM; P-N HETEROJUNCTIONS; PHOTORESPONSIVITY; QUARTZ SUBSTRATE; REVERSE BIAS; RF REACTIVE SPUTTERING; ROOM TEMPERATURE; ULTRA-VIOLET; ZNO;

EID: 84871720062     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.10.030     Document Type: Article
Times cited : (62)

References (30)
  • 22
    • 0003472812 scopus 로고
    • first ed. Dover Publications New York
    • B.E. Warren X-ray Diffraction first ed. 1990 Dover Publications New York
    • (1990) X-ray Diffraction
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.