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Volumn 21, Issue 12, 2006, Pages 1699-1702

Design, fabrication and characterization of an a-Si:H-based UV detector for sunburn applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; OPTIMIZATION; SEMICONDUCTING SILICON; THICKNESS MEASUREMENT; THIN FILMS; ULTRAVIOLET RADIATION;

EID: 33846853548     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/12/033     Document Type: Article
Times cited : (10)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.