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Volumn 2, Issue 2, 2012, Pages 180-196

Timing-error detection design considerations in subthreshold: An 8-bit microprocessor in 65 nm CMOS

Author keywords

Dynamic supply voltage; Dynamic voltage scaling; SCL; Subthreshold; Subthreshold sourcecoupled logic; Timing error detection; Ultra low power; Weak inversion

Indexed keywords


EID: 84871700697     PISSN: None     EISSN: 20799268     Source Type: Journal    
DOI: 10.3390/jlpea2020180     Document Type: Article
Times cited : (15)

References (19)
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    • Versace, M.1    Chandler, B.2
  • 6
    • 78650879825 scopus 로고    scopus 로고
    • A power-efficient 32 bit ARM processor using timing-error detection and correction for transient-error tolerance and adaptation to PVT variation
    • Bull, D.; Das, S.; Shivashankar, K.; Dasika, G.; Flautner, K.; Blaauw, D. A power-efficient 32 bit ARM processor using timing-error detection and correction for transient-error tolerance and adaptation to PVT variation. IEEE J. Solid State Circ. 2011, 46, 18-31.
    • (2011) IEEE J. Solid State Circ. , vol.46 , pp. 18-31
    • Bull, D.1    Das, S.2    Shivashankar, K.3    Dasika, G.4    Flautner, K.5    Blaauw, D.6
  • 9
    • 58149234982 scopus 로고    scopus 로고
    • A 65 nm sub-Vt microcontroller with integrated SRAM and switched capacitor DC-DC converter
    • Kwong, J.; Ramadass, Y.K.; Verma, N.; Chandrakasan, A.P. A 65 nm sub-Vt microcontroller with integrated SRAM and switched capacitor DC-DC converter. IEEE J. Solid State Circ. 2009, 44, 115-126.
    • (2009) IEEE J. Solid State Circ. , vol.44 , pp. 115-126
    • Kwong, J.1    Ramadass, Y.K.2    Verma, N.3    Chandrakasan, A.P.4
  • 16
    • 67349188103 scopus 로고    scopus 로고
    • Leakage current reduction using subthreshold source-coupled logic
    • Tajalli, A.; Leblebici, Y. Leakage current reduction using subthreshold source-coupled logic. IEEE Trans. Circuit Syst. II 2009, 56, 374-378.
    • (2009) IEEE Trans. Circuit Syst. II , vol.56 , pp. 374-378
    • Tajalli, A.1    Leblebici, Y.2
  • 19
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    • Energy-efficient and metastability-immune timing-error detection and instruction-replay-based recovery circuits for dyanmic-variation tolerance
    • San Francisco, CA, USA, 3-7 February
    • Bowman, K.; Tschanz, J.; Kim, N.; Lee, J.; Wilkerso, C.; Lu, S.; Karnik, T.; De, V. Energy-efficient and metastability-immune timing-error detection and instruction-replay-based recovery circuits for dyanmic-variation tolerance. In Proceedings of the IEEE International Solid-State Circuits Conference, San Francisco, CA, USA, 3-7 February 2008; pp. 402-403.
    • (2008) Proceedings of the IEEE International Solid-State Circuits Conference , pp. 402-403
    • Bowman, K.1    Tschanz, J.2    Kim, N.3    Lee, J.4    Wilkerso, C.5    Lu, S.6    Karnik, T.7    De, V.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.