Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL

2011 NORCHIP

Volumn , Issue , 2011, Pages

  Turnquist, Matthew J ^a   Laulainen, Erkka ^a   Mäkipää, Jani ^b   Koskinen, Lauri ^a  

^a AALTO UNIVERSITY   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CLOCK PERIOD; DETECTION WINDOWS; ERROR-DETECTION SEQUENTIAL; SOURCE COUPLED LOGIC; SUBTHRESHOLD; SUBTHRESHOLD SCL; SYSTEM LEVELS; SYSTEM-LEVEL REQUIREMENTS; TIMING ERROR DETECTION; TIMING MARGIN;

ERROR DETECTION;

MEASUREMENT ERRORS;

EID: 84856861013     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NORCHP.2011.6126746     Document Type: Conference Paper

References (12)

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