-
1
-
-
2342557097
-
Optimal supply and threshold scaling for sub-threshold CMOS circuits
-
Apr
-
A. Wang, A. Chandrakasan, and S. Kosonocky, "Optimal supply and threshold scaling for sub-threshold CMOS circuits," in IEEE Computer Society Annual Symp. VLSI, Apr. 2002, pp. 5-9.
-
(2002)
IEEE Computer Society Annual Symp. VLSI
, pp. 5-9
-
-
Wang, A.1
Chandrakasan, A.2
Kosonocky, S.3
-
2
-
-
11944273157
-
A 180-mV subthreshold FFT processor using a minimum energy design methodology
-
Jan
-
A. Wang and A. Chandrakasan, "A 180-mV subthreshold FFT processor using a minimum energy design methodology," IEEE J. Solid-State Circuits, vol. 40, no. 1, pp. 310-319, Jan. 2005.
-
(2005)
IEEE J. Solid-State Circuits
, vol.40
, Issue.1
, pp. 310-319
-
-
Wang, A.1
Chandrakasan, A.2
-
3
-
-
34547375943
-
A 2.60 pJ/Inst subthreshold sensor processor for optimal energy efficiency
-
Jun
-
B. Zhai, L. Nazhandali, J. Olson, A. Reeves, M. Minuth, R. Helfand, S. Pant, D. Blaauw, and T. Austin, "A 2.60 pJ/Inst subthreshold sensor processor for optimal energy efficiency," in Symp. VLSI Circuits Dig., Jun. 2006, pp. 154-155.
-
(2006)
Symp. VLSI Circuits Dig
, pp. 154-155
-
-
Zhai, B.1
Nazhandali, L.2
Olson, J.3
Reeves, A.4
Minuth, M.5
Helfand, R.6
Pant, S.7
Blaauw, D.8
Austin, T.9
-
4
-
-
39749186100
-
Performance and variability optimization strategies in a sub-200 mV, 3.5 pJ/inst, 11 nW subthreshold processor
-
Jun
-
S. Hanson, B. Zhai, M. Seok, B. Cline, K. Zhou, M. Singhal, M. Minuth, J. Olson, L. Nazhandali, T. Austin, D. Sylvester, and D. S. Blaauw, "Performance and variability optimization strategies in a sub-200 mV, 3.5 pJ/inst, 11 nW subthreshold processor," in Symp. VLSI Circuits Dig., Jun. 2007, pp. 152-153.
-
(2007)
Symp. VLSI Circuits Dig
, pp. 152-153
-
-
Hanson, S.1
Zhai, B.2
Seok, M.3
Cline, B.4
Zhou, K.5
Singhal, M.6
Minuth, M.7
Olson, J.8
Nazhandali, L.9
Austin, T.10
Sylvester, D.11
Blaauw, D.S.12
-
5
-
-
49549087968
-
A 320 mV 56 μW 411 GOPS/Watt ultra-low voltage motion estimation accelerator in 65 nm CMOS
-
Feb
-
H. Kaul, M. Anders, S. Mathew, S. Hsu, A. Agarwal, R. Krishnamurthy, and S. Borkar, "A 320 mV 56 μW 411 GOPS/Watt ultra-low voltage motion estimation accelerator in 65 nm CMOS," in IEEE ISSCC Dig. Tech. Papers, Feb. 2008, pp. 316-317.
-
(2008)
IEEE ISSCC Dig. Tech. Papers
, pp. 316-317
-
-
Kaul, H.1
Anders, M.2
Mathew, S.3
Hsu, S.4
Agarwal, A.5
Krishnamurthy, R.6
Borkar, S.7
-
6
-
-
33847724635
-
A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation
-
Mar
-
B. H. Calhoun and A. P. Chandrakasan, "A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation," IEEE J. Solid-State Circuits, vol. 42, no. 3, pp. 680-688, Mar. 2007.
-
(2007)
IEEE J. Solid-State Circuits
, vol.42
, Issue.3
, pp. 680-688
-
-
Calhoun, B.H.1
Chandrakasan, A.P.2
-
7
-
-
58149246684
-
-
Online, Available
-
MSP430. Texas Instruments. [Online]. Available: http://focus.ti.com/lit/ ug/slau056g/slau056g.pdf
-
MSP430. Texas Instruments
-
-
-
8
-
-
28444444598
-
Analysis and mitigation of variability in subthreshold design
-
Aug
-
B. Zhai, S. Hanson, D. Blaauw, and D. Sylvester, "Analysis and mitigation of variability in subthreshold design," in Proc. Int. Symp. Low-Power Electronics and Design (ISLPED), Aug. 2005, pp. 20-25.
-
(2005)
Proc. Int. Symp. Low-Power Electronics and Design (ISLPED)
, pp. 20-25
-
-
Zhai, B.1
Hanson, S.2
Blaauw, D.3
Sylvester, D.4
-
9
-
-
0024754187
-
Matching properties of MOS transistors
-
Oct
-
M. J. M. Pelgrom, A. C. J. Duinmaijer, and A. P. G. Welbers, "Matching properties of MOS transistors," IEEE J. Solid-State Circuits, vol. 24, no. 5, pp. 1433-1439, Oct. 1989.
-
(1989)
IEEE J. Solid-State Circuits
, vol.24
, Issue.5
, pp. 1433-1439
-
-
Pelgrom, M.J.M.1
Duinmaijer, A.C.J.2
Welbers, A.P.G.3
-
10
-
-
0020906578
-
Worst-case static noise margin criteria for logic circuits and their mathematical equivalence
-
Dec
-
J. Lohstroh, E. Seevinck, and J. D. Groot, "Worst-case static noise margin criteria for logic circuits and their mathematical equivalence," IEEE J. Solid-State Circuits, vol. SC-18, no. 6, pp. 803-807, Dec. 1983.
-
(1983)
IEEE J. Solid-State Circuits
, vol.SC-18
, Issue.6
, pp. 803-807
-
-
Lohstroh, J.1
Seevinck, E.2
Groot, J.D.3
-
12
-
-
11844253851
-
Highly accurate simple closed-form approximations to lognormal sum distributions and densities
-
Dec
-
N. C. Beaulieu and F. Rajwani, "Highly accurate simple closed-form approximations to lognormal sum distributions and densities," IEEE Commun. Lett., vol. 8, no. 12, pp. 709-711, Dec. 2004.
-
(2004)
IEEE Commun. Lett
, vol.8
, Issue.12
, pp. 709-711
-
-
Beaulieu, N.C.1
Rajwani, F.2
-
13
-
-
0020180746
-
On the distribution function and moments of power sums with log-normal components
-
Sep
-
S. Schwartz and Y. Yeh, "On the distribution function and moments of power sums with log-normal components," Bell Syst. Tech. J., vol. 61, no. 7, pp. 1441-1462, Sep. 1982.
-
(1982)
Bell Syst. Tech. J
, vol.61
, Issue.7
, pp. 1441-1462
-
-
Schwartz, S.1
Yeh, Y.2
-
14
-
-
39749142750
-
A test structure for characterizing local device mismatches
-
Jun
-
K. Agarwal, F. Liu, C. McDowell, S. Nassif, K. Nowka, M. Palmer, D. Acharyya, and J. Plusquellic, "A test structure for characterizing local device mismatches," in Symp. VLSI Circuits Dig., Jun. 2006, pp. 67-68.
-
(2006)
Symp. VLSI Circuits Dig
, pp. 67-68
-
-
Agarwal, K.1
Liu, F.2
McDowell, C.3
Nassif, S.4
Nowka, K.5
Palmer, M.6
Acharyya, D.7
Plusquellic, J.8
-
15
-
-
39749152930
-
Impact of layout on 90 nm CMOS process parameter fluctuations
-
L.-T. Pang and B. Nikolic, "Impact of layout on 90 nm CMOS process parameter fluctuations," in Symp. VLSI Circuits Dig., 2006, pp. 69-70.
-
(2006)
Symp. VLSI Circuits Dig
, pp. 69-70
-
-
Pang, L.-T.1
Nikolic, B.2
-
16
-
-
58149254134
-
An all-digital, highly scalable architecture for measurement of spatial variation in digital circuits
-
Nov
-
N. Drego, A. Chandrakasan, and D. Boning, "An all-digital, highly scalable architecture for measurement of spatial variation in digital circuits," in Proc. IEEE Asian Solid-State Circuits Conf., Nov. 2008, pp. 393-396.
-
(2008)
Proc. IEEE Asian Solid-State Circuits Conf
, pp. 393-396
-
-
Drego, N.1
Chandrakasan, A.2
Boning, D.3
-
17
-
-
0028548950
-
Experimental study of threshold voltage fluctuation due to statistical variation of channel dopant number in MOSFET's
-
Nov
-
T. Mizuno, J. Okumtura, and A. Toriumi, "Experimental study of threshold voltage fluctuation due to statistical variation of channel dopant number in MOSFET's," IEEE Trans. Electron Devices, vol. 41, no. 11, pp. 2216-2221, Nov. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, Issue.11
, pp. 2216-2221
-
-
Mizuno, T.1
Okumtura, J.2
Toriumi, A.3
-
18
-
-
0000923503
-
Asymptotic theory of certain "goodness of fit" criteria based on stochastic processes
-
T. W. Anderson and D. A. Darling, "Asymptotic theory of certain "goodness of fit" criteria based on stochastic processes," Ann. Mathemat. Statist., vol. 23, no. 2, pp. 193-212, 1952.
-
(1952)
Ann. Mathemat. Statist
, vol.23
, Issue.2
, pp. 193-212
-
-
Anderson, T.W.1
Darling, D.A.2
-
19
-
-
0023437909
-
Static-noise margin analysis of MOS SRAM cells
-
Oct
-
E. Seevinck, F. J. List, and J. Lohstroh, "Static-noise margin analysis of MOS SRAM cells," IEEE J. Solid-State Circuits, vol. SC-22, no. 5, pp. 748-754, Oct. 1987.
-
(1987)
IEEE J. Solid-State Circuits
, vol.SC-22
, Issue.5
, pp. 748-754
-
-
Seevinck, E.1
List, F.J.2
Lohstroh, J.3
-
20
-
-
0035308547
-
The impact of intrinsic device fluctuations on CMOS SRAM cell stability
-
Apr
-
A. Bhavnagarwala, X. Tang, and J. Meindl, "The impact of intrinsic device fluctuations on CMOS SRAM cell stability," IEEE J. Solid-State Circuits, vol. 36, no. 4, pp. 658-665, Apr. 2001.
-
(2001)
IEEE J. Solid-State Circuits
, vol.36
, Issue.4
, pp. 658-665
-
-
Bhavnagarwala, A.1
Tang, X.2
Meindl, J.3
-
21
-
-
85008054031
-
A 256-kb 65 nm 8 T subthreshold SRAM employing sense-amplifier redundancy
-
Jan
-
N. Verma and A. P. Chandrakasan, "A 256-kb 65 nm 8 T subthreshold SRAM employing sense-amplifier redundancy," IEEE J. Solid-State Circuits, vol. 43, no. 1, pp. 141-149, Jan. 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.1
, pp. 141-149
-
-
Verma, N.1
Chandrakasan, A.P.2
-
23
-
-
0024755327
-
Reverse short-channel effects on threshold voltage in submicrometer salicide devices
-
Oct
-
C.-Y. Lu and J. M. Sung, "Reverse short-channel effects on threshold voltage in submicrometer salicide devices," IEEE Electron Device Lett., vol. 10, no. 10, pp. 446-448, Oct. 1989.
-
(1989)
IEEE Electron Device Lett
, vol.10
, Issue.10
, pp. 446-448
-
-
Lu, C.-Y.1
Sung, J.M.2
-
24
-
-
37749025732
-
Nanometer MOSFET variation in minimum energy subthreshold circuits
-
Jan
-
N. Verma, J. Kwong, and A. P. Chandrakasan, "Nanometer MOSFET variation in minimum energy subthreshold circuits," IEEE Trans. Electron Devices, vol. 55, no. 1, pp. 163-174, Jan. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.1
, pp. 163-174
-
-
Verma, N.1
Kwong, J.2
Chandrakasan, A.P.3
-
25
-
-
38849084539
-
A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing
-
Feb
-
T.-H. Kim, J. Liu, J. Keane, and C. H. Kim, "A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing," IEEE J. Solid-State Circuits, vol. 43, no. 2, pp. 518-529, Feb. 2008.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, Issue.2
, pp. 518-529
-
-
Kim, T.-H.1
Liu, J.2
Keane, J.3
Kim, C.H.4
-
26
-
-
48349094537
-
Voltage scalable switched capacitor DC-DC converter for ultra-low-power on-chip applications
-
Y. K. Ramadass and A. P. Chandrakasan, "Voltage scalable switched capacitor DC-DC converter for ultra-low-power on-chip applications," in Proc. Power Electronics Specialists Conf., 2007, pp. 2353-2359.
-
(2007)
Proc. Power Electronics Specialists Conf
, pp. 2353-2359
-
-
Ramadass, Y.K.1
Chandrakasan, A.P.2
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