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Volumn 44, Issue 1, 2009, Pages 115-126

A 65 nm Sub-t microcontroller with integrated SRAM and switched capacitor DC-DC converter

Author keywords

CMOS digital integrated circuits; DC DC conversion; Leakage currents; Logic design; Low power electronics; SRAM; Subthreshold

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITANCE; CAPACITORS; CMOS INTEGRATED CIRCUITS; CONTROL SYSTEM STABILITY; DC-DC CONVERTERS; DIELECTRIC DEVICES; DIGITAL CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC EQUIPMENT; HVDC POWER TRANSMISSION; INTEGRATED CIRCUITS; LEAKAGE CURRENTS; LOGIC DESIGN; MICROCONTROLLERS; POWER CONVERTERS; POWER ELECTRONICS; STATIC RANDOM ACCESS STORAGE; SWITCHING THEORY;

EID: 58149234982     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2008.2007160     Document Type: Conference Paper
Times cited : (207)

References (26)
  • 2
    • 11944273157 scopus 로고    scopus 로고
    • A 180-mV subthreshold FFT processor using a minimum energy design methodology
    • Jan
    • A. Wang and A. Chandrakasan, "A 180-mV subthreshold FFT processor using a minimum energy design methodology," IEEE J. Solid-State Circuits, vol. 40, no. 1, pp. 310-319, Jan. 2005.
    • (2005) IEEE J. Solid-State Circuits , vol.40 , Issue.1 , pp. 310-319
    • Wang, A.1    Chandrakasan, A.2
  • 6
    • 33847724635 scopus 로고    scopus 로고
    • A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation
    • Mar
    • B. H. Calhoun and A. P. Chandrakasan, "A 256-kb 65-nm sub-threshold SRAM design for ultra-low-voltage operation," IEEE J. Solid-State Circuits, vol. 42, no. 3, pp. 680-688, Mar. 2007.
    • (2007) IEEE J. Solid-State Circuits , vol.42 , Issue.3 , pp. 680-688
    • Calhoun, B.H.1    Chandrakasan, A.P.2
  • 7
    • 58149246684 scopus 로고    scopus 로고
    • Online, Available
    • MSP430. Texas Instruments. [Online]. Available: http://focus.ti.com/lit/ ug/slau056g/slau056g.pdf
    • MSP430. Texas Instruments
  • 10
    • 0020906578 scopus 로고
    • Worst-case static noise margin criteria for logic circuits and their mathematical equivalence
    • Dec
    • J. Lohstroh, E. Seevinck, and J. D. Groot, "Worst-case static noise margin criteria for logic circuits and their mathematical equivalence," IEEE J. Solid-State Circuits, vol. SC-18, no. 6, pp. 803-807, Dec. 1983.
    • (1983) IEEE J. Solid-State Circuits , vol.SC-18 , Issue.6 , pp. 803-807
    • Lohstroh, J.1    Seevinck, E.2    Groot, J.D.3
  • 12
    • 11844253851 scopus 로고    scopus 로고
    • Highly accurate simple closed-form approximations to lognormal sum distributions and densities
    • Dec
    • N. C. Beaulieu and F. Rajwani, "Highly accurate simple closed-form approximations to lognormal sum distributions and densities," IEEE Commun. Lett., vol. 8, no. 12, pp. 709-711, Dec. 2004.
    • (2004) IEEE Commun. Lett , vol.8 , Issue.12 , pp. 709-711
    • Beaulieu, N.C.1    Rajwani, F.2
  • 13
    • 0020180746 scopus 로고
    • On the distribution function and moments of power sums with log-normal components
    • Sep
    • S. Schwartz and Y. Yeh, "On the distribution function and moments of power sums with log-normal components," Bell Syst. Tech. J., vol. 61, no. 7, pp. 1441-1462, Sep. 1982.
    • (1982) Bell Syst. Tech. J , vol.61 , Issue.7 , pp. 1441-1462
    • Schwartz, S.1    Yeh, Y.2
  • 15
    • 39749152930 scopus 로고    scopus 로고
    • Impact of layout on 90 nm CMOS process parameter fluctuations
    • L.-T. Pang and B. Nikolic, "Impact of layout on 90 nm CMOS process parameter fluctuations," in Symp. VLSI Circuits Dig., 2006, pp. 69-70.
    • (2006) Symp. VLSI Circuits Dig , pp. 69-70
    • Pang, L.-T.1    Nikolic, B.2
  • 16
    • 58149254134 scopus 로고    scopus 로고
    • An all-digital, highly scalable architecture for measurement of spatial variation in digital circuits
    • Nov
    • N. Drego, A. Chandrakasan, and D. Boning, "An all-digital, highly scalable architecture for measurement of spatial variation in digital circuits," in Proc. IEEE Asian Solid-State Circuits Conf., Nov. 2008, pp. 393-396.
    • (2008) Proc. IEEE Asian Solid-State Circuits Conf , pp. 393-396
    • Drego, N.1    Chandrakasan, A.2    Boning, D.3
  • 17
    • 0028548950 scopus 로고
    • Experimental study of threshold voltage fluctuation due to statistical variation of channel dopant number in MOSFET's
    • Nov
    • T. Mizuno, J. Okumtura, and A. Toriumi, "Experimental study of threshold voltage fluctuation due to statistical variation of channel dopant number in MOSFET's," IEEE Trans. Electron Devices, vol. 41, no. 11, pp. 2216-2221, Nov. 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , Issue.11 , pp. 2216-2221
    • Mizuno, T.1    Okumtura, J.2    Toriumi, A.3
  • 18
    • 0000923503 scopus 로고
    • Asymptotic theory of certain "goodness of fit" criteria based on stochastic processes
    • T. W. Anderson and D. A. Darling, "Asymptotic theory of certain "goodness of fit" criteria based on stochastic processes," Ann. Mathemat. Statist., vol. 23, no. 2, pp. 193-212, 1952.
    • (1952) Ann. Mathemat. Statist , vol.23 , Issue.2 , pp. 193-212
    • Anderson, T.W.1    Darling, D.A.2
  • 19
    • 0023437909 scopus 로고
    • Static-noise margin analysis of MOS SRAM cells
    • Oct
    • E. Seevinck, F. J. List, and J. Lohstroh, "Static-noise margin analysis of MOS SRAM cells," IEEE J. Solid-State Circuits, vol. SC-22, no. 5, pp. 748-754, Oct. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.SC-22 , Issue.5 , pp. 748-754
    • Seevinck, E.1    List, F.J.2    Lohstroh, J.3
  • 20
    • 0035308547 scopus 로고    scopus 로고
    • The impact of intrinsic device fluctuations on CMOS SRAM cell stability
    • Apr
    • A. Bhavnagarwala, X. Tang, and J. Meindl, "The impact of intrinsic device fluctuations on CMOS SRAM cell stability," IEEE J. Solid-State Circuits, vol. 36, no. 4, pp. 658-665, Apr. 2001.
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.4 , pp. 658-665
    • Bhavnagarwala, A.1    Tang, X.2    Meindl, J.3
  • 21
    • 85008054031 scopus 로고    scopus 로고
    • A 256-kb 65 nm 8 T subthreshold SRAM employing sense-amplifier redundancy
    • Jan
    • N. Verma and A. P. Chandrakasan, "A 256-kb 65 nm 8 T subthreshold SRAM employing sense-amplifier redundancy," IEEE J. Solid-State Circuits, vol. 43, no. 1, pp. 141-149, Jan. 2008.
    • (2008) IEEE J. Solid-State Circuits , vol.43 , Issue.1 , pp. 141-149
    • Verma, N.1    Chandrakasan, A.P.2
  • 23
    • 0024755327 scopus 로고
    • Reverse short-channel effects on threshold voltage in submicrometer salicide devices
    • Oct
    • C.-Y. Lu and J. M. Sung, "Reverse short-channel effects on threshold voltage in submicrometer salicide devices," IEEE Electron Device Lett., vol. 10, no. 10, pp. 446-448, Oct. 1989.
    • (1989) IEEE Electron Device Lett , vol.10 , Issue.10 , pp. 446-448
    • Lu, C.-Y.1    Sung, J.M.2
  • 24
    • 37749025732 scopus 로고    scopus 로고
    • Nanometer MOSFET variation in minimum energy subthreshold circuits
    • Jan
    • N. Verma, J. Kwong, and A. P. Chandrakasan, "Nanometer MOSFET variation in minimum energy subthreshold circuits," IEEE Trans. Electron Devices, vol. 55, no. 1, pp. 163-174, Jan. 2008.
    • (2008) IEEE Trans. Electron Devices , vol.55 , Issue.1 , pp. 163-174
    • Verma, N.1    Kwong, J.2    Chandrakasan, A.P.3
  • 25
    • 38849084539 scopus 로고    scopus 로고
    • A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing
    • Feb
    • T.-H. Kim, J. Liu, J. Keane, and C. H. Kim, "A 0.2 V, 480 kb subthreshold SRAM with 1 k cells per bitline for ultra-low-voltage computing," IEEE J. Solid-State Circuits, vol. 43, no. 2, pp. 518-529, Feb. 2008.
    • (2008) IEEE J. Solid-State Circuits , vol.43 , Issue.2 , pp. 518-529
    • Kim, T.-H.1    Liu, J.2    Keane, J.3    Kim, C.H.4
  • 26
    • 48349094537 scopus 로고    scopus 로고
    • Voltage scalable switched capacitor DC-DC converter for ultra-low-power on-chip applications
    • Y. K. Ramadass and A. P. Chandrakasan, "Voltage scalable switched capacitor DC-DC converter for ultra-low-power on-chip applications," in Proc. Power Electronics Specialists Conf., 2007, pp. 2353-2359.
    • (2007) Proc. Power Electronics Specialists Conf , pp. 2353-2359
    • Ramadass, Y.K.1    Chandrakasan, A.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.