|
Volumn 56, Issue 5, 2009, Pages 374-378
|
Leakage current reduction using subthreshold source-coupled logic
a
EPFL
(Switzerland)
|
Author keywords
CMOS digital circuits; Leakage; Source coupled logic (SCL); Subthreshold CMOS; Subthreshold SCL (STSCL)
|
Indexed keywords
CMOS INTEGRATED CIRCUITS;
COUPLED CIRCUITS;
DELAY CIRCUITS;
ELECTRIC POWER UTILIZATION;
EMITTER COUPLED LOGIC CIRCUITS;
LEAKAGE (FLUID);
LEAKAGE CURRENTS;
LOW POWER ELECTRONICS;
SENSITIVITY ANALYSIS;
TOPOLOGY;
CMOS DIGITAL CIRCUITS;
LEAKAGE CURRENT REDUCTION;
NANOMETER-SCALE TECHNOLOGIES;
SOURCE COUPLED LOGIC;
SUB-THRESHOLD LEAKAGE CURRENTS;
SUBTHRESHOLD CMOS;
SUBTHRESHOLD SCL (STSCL);
ULTRALOW POWER APPLICATION;
COMPUTER CIRCUITS;
|
EID: 67349188103
PISSN: 15497747
EISSN: 15583791
Source Type: Journal
DOI: 10.1109/TCSII.2009.2019167 Document Type: Article |
Times cited : (28)
|
References (8)
|