Imaging of sub-surface nano particles by tapping-mode atomic force microscopy

Polymer

Volumn 42, Issue 5, 2001, Pages 2259-2262

  Feng, Jiyun ^a   Weng, Lu Tao ^a   Chan, Chi Ming ^a   Xhie, Jie ^a   Lin, Li ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

SIMS; TM AFM; XPS

Indexed keywords

EID: 0034155297     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(00)00464-X     Document Type: Article

References (8)

1. Chan CM. Polymer surface modification and characterization. New York: Hanser, 1994.
2. Briggs D. Surface analysis of polymer surfaces by XPS and SIMS. Cambridge: Cambridge University Press, 1998.
3. Briggs D, Ratner BD. Polym Commun 1988;29:6.
4. Briggs D, Brown A, Vickerman JC. Handbook of static secondary ion mass spectrometry (SIMS). New York: Wiley, 1989.
5. Newman JG, Carlson BA, Michael RS, Moulder JF, Holt TH. Static SIMS handbook of polymer analysis. Perkin-Elmer, 1991.
6. Beamson G, Briggs D. High resolution XPS of organic polymers: the scienta ESCA 300 database. New York: Wiley, 1992.
7. Goss CA, Brumfield JC, Irene EA, Murray RW. Langmuir 1992;8:1459.
8. Yang ACM, Terris BD, Kunz M. Macromolecules 1991;24:6800.