Three-dimensional tomography of single charge inside dielectric materials using electrostatic force microscopy

Materials Research Society Symposium Proceedings

Volumn 1421, Issue , 2012, Pages 1-6

  Riedel, Clement ^a,b   Arinero, Richard ^a   Alegria, Angel ^b   Colmenero, Juan ^b   Saenz, Juan Jose ^b,c  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CORRELATED SIGNALS; ELECTROSTATIC FORCE MICROSCOPY; EQUIVALENT CHARGES; LATERAL RESOLUTION; RECONSTRUCTION ALGORITHMS; THREE-DIMENSIONAL TOMOGRAPHY; TIP-SAMPLE DISTANCE;

ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; THREE DIMENSIONAL;

TOMOGRAPHY;

EID: 84879379381     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2012.53     Document Type: Conference Paper

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