Effects of Al and Sn dopants on the structural and optical properties of ZnO thin films

Superlattices and Microstructures

Volumn 54, Issue 1, 2013, Pages 107-117

  Pan, Zhanchang ^a   Tian, Xinlong ^a   Wu, Shoukun ^b   Xiao, Chumin ^a   Li, Zhuliang ^b   Deng, Jianfeng ^b   Hu, Guanghui ^a   Wei, Zhigang ^a  

^a GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

^b Huizhou King Brother Electronic Technology Co   (China)

Author keywords

Al doped ZnO; Sn doped ZnO; Sol gel method; XPS

Indexed keywords

4-POINT PROBE; AL-DOPED ZNO; AL-DOPING; DOPED ZNO THIN FILMS; DOPING CONCENTRATION; ELECTRICAL AND OPTICAL PROPERTIES; GLASS SUBSTRATES; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SN DOPING; SN-DOPED; SOL-GEL PROCESSING; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURE AND MORPHOLOGY; TRANSMISSION ELECTRON MICROSCOPY TEM; UV-VIS SPECTROSCOPY; VISIBLE RANGE; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES; ZNO THIN FILM;

ALUMINUM; DOPING (ADDITIVES); ELECTRIC PROPERTIES; METALLIC FILMS; OPTICAL FILMS; OPTICAL PROPERTIES; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

TIN;

EID: 84871228705     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2012.11.003     Document Type: Article

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