On the structure and characterization of Al, Sc-co-doped ZnO-films varying with 0-2.37 wt.% Sc contents

Thin Solid Films

Volumn 517, Issue 17, 2009, Pages 4715-4719

  Lin, Jing Chie ^a   Peng, Kun Cheng ^a,b   Yeh, Tai You ^c   Lee, Sheng Long ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b MING CHI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^c NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Al; Al doped film; Columnar grains; Conducting film; Red shifted; Sc co doped; Transparent; ZnO Electrical resistivity

Indexed keywords

AL; AL-DOPED FILM; COLUMNAR GRAINS; CONDUCTING FILM; RED-SHIFTED; SC CO-DOPED; TRANSPARENT; ZNO ELECTRICAL RESISTIVITY;

ALUMINUM; DOPING (ADDITIVES); ELECTRIC RESISTANCE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; STACKING FAULTS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZINC SULFIDE;

SCANDIUM;

EID: 65649095188     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.022     Document Type: Article

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