Direct extraction of carrier mobility in graphene field-effect transistor using current-voltage and capacitance-voltage measurements

Applied Physics Letters

Volumn 101, Issue 21, 2012, Pages

  Zhang, Zhiyong ^a   Xu, Huilong ^a   Zhong, Hua ^a   Peng, Lian Mao ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC EQUATIONS; CAPACITANCE VOLTAGE MEASUREMENTS; CURRENT VOLTAGE; DATA SETS; DIRECT EXTRACTION; GATE CAPACITANCE; GATE OXIDE CAPACITANCE; GATE VOLTAGES; GRAPHENE DEVICES; RESIDUAL CARRIER DENSITY; SERIES RESISTANCES; TRANSFER CURVES;

CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC RESISTANCE; FIELD EFFECT TRANSISTORS; GATE DIELECTRICS; OXIDE FILMS;

GRAPHENE;

EID: 84870013817     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4768690     Document Type: Article

References (21)

1. F. Schwierz, Nat. Nanotechnol. 5, 487 (2010). 10.1038/nnano.2010.89
2. I. Meric, M. Y. Han, A. F. Young, B. Ozyilmaz, P. Kim, and K. L. Shepard, Nat. Nanotechnol. 3, 654 (2008). 10.1038/nnano.2008.268
3. D. B. Farmer, H.-Y. Chiu, Y.-M. Lin, K. A. Jenkins, F. N. Xia, and P. Avouris, Nano Lett. 9, 4474 (2009). 10.1021/nl902788u
4. L. Liao, J. W. Bai, Y. Q. Qu, Y. C. Lin, Y. J. Li, Y. Huang, and X. F. Duan, Proc. Natl. Acad. Sci. U.S.A. 107, 6711 (2010). 10.1073/pnas.0914117107
5. Y.-M. Lin, C. Dimitrakopoulos, K. A. Jenkins, D. B. Farmer, H.-Y. Chiu, A. Grill, and Ph. Avouris, Science 327, 662 (2010). 10.1126/science.1184289
6. L. Liao, Y.-C. Lin, M. Bao, R. Cheng, J. Bai, Y. Liu, Y. Qu, K. L. Wang, Y. Huang, and X. Duan, Nature 467, 305 (2010). 10.1038/nature09405
7. L. A. Ponomarenko, R. Yang, R. V. Gorbachev, P. Blake, A. S. Mayorov, K. S. Novoselov, M. I. Katsnelson, and A. K. Geim, Phys. Rev. Lett. 105, 136801 (2010). 10.1103/PhysRevLett.105.136801
8. H. L. Xu, Z. Y. Zhang, H. T. Xu, Z. X. Wang, S. Wang, and L. M. Peng, ACS Nano 5, 5031 (2011). 10.1021/nn201115p
9. Y. Wu, K. A. Jenkins, A. Valdes-Garcia, D. B. Farmer, Y. Zhu, A. A. Bol, C. Dimitrakopoulos, W. Zhu, F. Xia, P. Avouris and Y.-M. Lin, Nano Lett. 12, 3062 (2012). 10.1021/nl300904k
10. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, M. I. Katsnelson, I. V. Grigorieva, S. V. Dubonos, and A. A. Firsov, Nature (London) 438, 197 (2005). 10.1038/nature04233
11. S. Kim, J. Nah, I. Jo, D. Shahrjerdi, L. Colombo, Z. Yao, E. Tutuc, and S. Banerjee, Appl. Phys. Lett. 94, 062107 (2009). 10.1063/1.3077021
12. J. Xia, F. Chen, J. H. Li, and N. J. Tao, Nat. Nanotechnol. 4, 505 (2009). 10.1038/nnano.2009.177
13. H. L. Xu, Z. Y. Zhang, Z. X. Wang, S. Wang, X. L. Liang, and L.-M. Peng, ACS Nano 5, 2340 (2011). 10.1021/nn200026e
14. H. L. Xu, Z. Y. Zhang, and L.-M. Peng, Appl. Phys. Lett. 98, 133122 (2011). 10.1063/1.3574011
15. Z. X. Wang, H. L. Xu, Z. Y. Zhang, S. Wang, L. Ding, Q. S. Zeng, L. J. Yang, T. Pei, X. L. Liang, M. Gao, and L. M. Peng, Nano Lett. 10, 2024 (2010). 10.1021/nl100022u
16. E. H. Hwang, S. Adam, and S. Das Sarma, Phys. Rev. Lett. 98, 186806 (2007). 10.1103/PhysRevLett.98.186806
17. S. Adam, E. H. Hwang, V. M. Galitski, and S. D. Sarma, Proc. Natl. Acad. Sci. U.S.A. 104, 18392 (2007). 10.1073/pnas.0704772104
18. Y. Zhang, V. W. Brar, C. Girit, A. Zettl, and M. F. Crommie, Nat. Phys. 5, 722 (2009). 10.1038/nphys1365
19. J. Martin, N. Akerman, G. Ulbricht, T. Lohmann, J. H. Smet, K. von Klitzing, and A. Yacoby, Nat. Phys. 4, 144 (2008). 10.1038/nphys781
20. Y. B. Zhang, Y. W. Tan, H. L. Stormer, and P. Kim, Nature 438, 201 (2005). 10.1038/nature04235
21. Y.-W. Tan, Y. Zhang, K. Bolotin, Y. Zhao, S. Adam, E. H. Hwang, S. Das Sarma, H. L. Stormer, and P. Kim, Phys. Rev. Lett. 99, 246803 (2007). 10.1103/PhysRevLett.99.246803