메뉴 건너뛰기




Volumn 22, Issue 11, 2012, Pages 595-597

High resolution scanning microwave microscopy for applications in liquid environment

Author keywords

Liquid environment; scanning microwave microscopy (SMM); vector network analyzer

Indexed keywords

AQUEOUS ENVIRONMENT; FAR-FIELD; HIGH RESOLUTION SCANNING; HIGHLY ORIENTED PYROLITIC GRAPHITES; LIQUID ENVIRONMENT; MICROWAVE MICROSCOPY; NANOMETRIC RESOLUTION; NEAR-FIELD; PROBE-SAMPLE INTERACTIONS; SCANNING MICROWAVE MICROSCOPES; SCANNING TUNNELING MICROSCOPES; SPATIAL POINTS; TIME DOMAIN; ULTRA-BROADBAND; VECTOR NETWORK ANALYZERS;

EID: 84869430115     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2012.2225607     Document Type: Article
Times cited : (28)

References (18)
  • 1
    • 0000738890 scopus 로고    scopus 로고
    • Near-field scanning microwave microscope with 100 μm resolution
    • C. P. Vlahacos, R. C. Black, S.M. Anlage, A. Amar, and F. C. Wellstood, "Near-field scanning microwave microscope with 100 resolution," Appl. Phys. Lett., vol. 69, no. 21, pp. 3272-3274, 1996. (Pubitemid 126605878)
    • (1996) Applied Physics Letters , vol.69 , Issue.21 , pp. 3272-3274
    • Vlahacos, C.P.1    Black, R.C.2    Anlage, S.M.3    Amar, A.4    Wellstood, F.C.5
  • 2
    • 0037375489 scopus 로고    scopus 로고
    • A novel STM-assisted microwave microscope with capacitance and loss imaging capability
    • DOI 10.1016/S0304-3991(02)00291-7, PII S0304399102002917
    • A. Imtiaz and S.M. Anlage, "A novel STM-Assisted microwave microscope with capacitance and loss imaging capability," Ultramicroscopy, vol. 94, no. 3, pp. 209-216, 2003. (Pubitemid 36061261)
    • (2003) Ultramicroscopy , vol.94 , Issue.3-4 , pp. 209-216
    • Imtiaz, A.1    Anlage, S.M.2
  • 3
    • 34547402490 scopus 로고    scopus 로고
    • Combining near-field scanning microwave microscopy with transport measurement for imaging current-obstructing defects in HTS films
    • DOI 10.1109/TASC.2007.899569
    • J. R. Dizon, X. Wang, R. S. Aga, and J. Z. Wu, "Combining nearfield scanning microwave microscopy with transport measurement for imaging current-obstructing defects in HTS films," IEEE Trans. Appl. Supercond., vol. 17, no. 2, pp. 3219-3222, Jun. 2007. (Pubitemid 47166568)
    • (2007) IEEE Transactions on Applied Superconductivity , vol.17 , Issue.2 , pp. 3219-3222
    • Dizon, J.R.1    Wang, X.2    Aga Jr., R.S.3    Wu, J.Z.4
  • 6
    • 3042682772 scopus 로고    scopus 로고
    • Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach
    • C. Gao, B. Hu, P. Zhang, M. Huang, W. Liu, and I. Takeuchi, "Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach," Appl. Phys. Lett, vol. 84, no. 23, pp. 4647-4647-3, 2004.
    • (2004) Appl. Phys. Lett , vol.84 , Issue.23 , pp. 4647-4647
    • Gao, C.1    Hu, B.2    Zhang, P.3    Huang, M.4    Liu, W.5    Takeuchi, I.6
  • 7
    • 0000005683 scopus 로고
    • Alternating current scanning tunnelling microscopy and nonlinear spectroscopy
    • S. L. Stranick and P. S.Weiss, "Alternating current scanning tunnelling microscopy and nonlinear spectroscopy," J. Phys. Chem., vol. 98, no. 7, pp. 1762-1764, 1994.
    • (1994) J. Phys. Chem , vol.98 , Issue.7 , pp. 1762-1764
    • Stranick, S.L.1    Weiss, P.S.2
  • 8
    • 84866104670 scopus 로고    scopus 로고
    • Near-field microwave scanning probe imaging of conductivity inhomogeneities in cvd graphene
    • A. Tselev, N. V. Lavrik, I. Vlassiouk, D. P. Briggs, M. Rutgers, R. Proksch, and S. V. Kalinin, "Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD graphene," Nanotechnology, vol. 23, no. 38, pp. 385706-385706-11, 2012.
    • (2012) Nanotechnology , vol.23 , Issue.38 , pp. 385706-385706
    • Tselev, A.1    Lavrik, N.V.2    Vlassiouk, I.3    Briggs, D.P.4    Rutgers, M.5    Proksch, R.6    Kalinin, S.V.7
  • 10
    • 78649241747 scopus 로고    scopus 로고
    • Atomic resolution imaging at 2.5 ghz using near-field microwave microscopy
    • J. Lee, C. J. Long, H. Yang, X. D. Xiang, and I. Takeuchi, "Atomic resolution imaging at 2.5 GHz using near-field microwave microscopy," Appl. Phys. Lett., vol. 97, pp. 183111-183111-3, 2010.
    • Appl. Phys. Lett , vol.97 , Issue.2010 , pp. 183111-183113
    • Lee, J.1    Long, C.J.2    Yang, H.3    Xiang, X.D.4    Takeuchi, I.5
  • 11
    • 12344250980 scopus 로고    scopus 로고
    • Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries
    • DOI 10-1088/0957-0233/16/1/033, Combinatorial and High-Throughput Materials Research
    • C. Gao, B. Hu, I. Takeuchi, K. S. Chang, X. D. Xiang, and G. Wang, "Quantitative scanning evanescent microwave microscopy and its applicationsin characterization of functional materials libraries," Meas. Sci. Technol., vol. 16, pp. 248-260, 2005. (Pubitemid 40133887)
    • (2005) Measurement Science and Technology , vol.16 , Issue.1 , pp. 248-260
    • Gao, C.1    Hu, B.2    Takeuchi, I.3    Chang, K.-S.4    Xiang, X.-D.5    Wang, G.6
  • 13
    • 20844436877 scopus 로고    scopus 로고
    • Distance control for a near-field scanning microwave microscope in liquid using a quartz tuning fork
    • S. Kim, H. Yoo, K. Lee, B. Friedman, M. A. Gaspar, and R. Levicky, "Distance control for a near-field scanning microwave microscope in liquid using a quartz tuning fork," Appl. Phys. Lett., vol. 86, no. 15, p. 153506-3, 2005.
    • (2005) Appl. Phys. Lett , vol.86 , Issue.15 , pp. 153506-153503
    • Kim, S.1    Yoo, H.2    Lee, K.3    Friedman, B.4    Gaspar, M.A.5    Levicky, R.6
  • 15
    • 1842430982 scopus 로고    scopus 로고
    • Design and fabrication of scanning nearfield microwave probes compatible with atomic force microscopy to image embedded nanostructures
    • Mar
    • M. Tabib-Azar and Y.Wang, "Design and fabrication of scanning nearfield microwave probes compatible with atomic force microscopy to image embedded nanostructures," IEEE Trans. Microw. Theory Tech., vol. 52, no. 3, pp. 971-979, Mar. 2004.
    • (2004) IEEE Trans. Microw. Theory Tech , vol.52 , Issue.3 , pp. 971-979
    • Tabib-Azar, M.1    Wang, Y.2
  • 16
    • 0035679966 scopus 로고    scopus 로고
    • A 3-D integral equation-based approach to the analysis of real-life MMICs - Application to microelectromechanical systems
    • DOI 10.1109/22.971605, PII S0018948001104734, 2001 International Microwave Symposium
    • M. Farina and T. Rozzi, "A 3-D integral equation-based approach to the analysis of real-life MMICs-Application to microelectromechanical systems," IEEE Trans. Microw. Theory Tech., vol. 49, no. 12, pp. 2235-2240, Dec. 2001. (Pubitemid 34055382)
    • (2001) IEEE Transactions on Microwave Theory and Techniques , vol.49 , Issue.12 , pp. 2235-2240
    • Farina, M.1    Rozzi, T.2
  • 17
    • 33846439015 scopus 로고    scopus 로고
    • Electric near-field enhancement of a sharp semi-infinite conical probe: Material and cone angle dependence
    • A. Goncharenko, J. K. Wang, and Y. C. Chang, "Electric near-field enhancement of a sharp semi-infinite conical probe: Material and cone angle dependence," Phys. Rev. B, vol. 74, no. 23, p. 235442-9, 2006.
    • (2006) Phys. Rev. B , vol.74 , Issue.23 , pp. 235442-235449
    • Goncharenko, A.1    Wang, J.K.2    Chang, Y.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.