Combining near-field scanning microwave microscopy with transport measurement for imaging current-obstructing defects in HTS films

IEEE Transactions on Applied Superconductivity

Volumn 17, Issue 2, 2007, Pages 3219-3222

  Dizon, Jonathan R ^a   Wang, Xiang ^a   Aga Jr , Roberto S ^b   Wu, Judy Z ^a  

^a UNIVERSITY OF KANSAS   (United States)

^b FISK UNIVERSITY   (United States)

Author keywords

Defects; Mapping; Microwave heating; Near field scanning microwave microscopy

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; MICROWAVE HEATING; PERMITTIVITY; SUPERCONDUCTING FILMS;

NEAR-FIELD SCANNING MICROWAVE MICROSCOPY; TRANSPORT MEASUREMENT;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 34547402490     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2007.899569     Document Type: Conference Paper

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