Atomic resolution imaging at 2.5 GHz using near-field microwave microscopy

Applied Physics Letters

Volumn 97, Issue 18, 2010, Pages

  Lee, Jonghee ^a   Long, Christian J ^b   Yang, Haitao ^c   Xiang, Xiao Dong ^c   Takeuchi, Ichiro ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b University of Maryland   (United States)

^c Intematix Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION IMAGES; ATOMIC-RESOLUTION IMAGING; AU(1 1 1 ); COAXIAL MICROWAVE RESONATOR; GIGAHERTZ FREQUENCIES; LOW FREQUENCY; MICROWAVE MICROSCOPES; NEAR-FIELD MICROWAVE MICROSCOPY; QUALITY FACTORS; RESONANT FREQUENCIES; SCAN-HEAD; TIP-SAMPLE DISTANCE; TUNNEL CURRENTS; TUNNELING REGIME;

MICROSCOPES; MICROWAVE DEVICES; MICROWAVES; NATURAL FREQUENCIES; TUNNEL JUNCTIONS;

ATOMS;

EID: 78649241747     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3514243     Document Type: Article

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