Detection of defects buried in metallic samples by scanning microwave microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 12, 2011, Pages

  Plassard, C ^a   Bourillot, E ^a   Rossignol, J ^a   Lacroute, Y ^a   Lepleux, E ^b   Pacheco, L ^b   Lesniewska, E ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

^b ScienTec   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961053085     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.121409     Document Type: Article

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