SCOPUS 정보 검색 플랫폼

RSC Advances

Volumn 2, Issue 30, 2012, Pages 11472-11480

Super-wetting, wafer-sized silicon nanowire surfaces with hierarchical roughness and low defects

(4) Egatz Gomez, Ana a Majithia, Ravish a,b Levert, Christopher a Meissner, Kenith E a,b

a Texas A M University (United States)

b Department of Electrical and Computer Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CONTAMINATION; DROPS; HYDROCARBONS; NANOWIRES; NITROGEN COMPOUNDS; SILICON COMPOUNDS; SILICON WAFERS; SUBSTRATES; SURFACE DEFECTS; SURFACE ROUGHNESS;

CROSS CONTAMINATION; FLUORINATED HYDROCARBONS; HIERARCHICAL SURFACES; METAL-ASSISTED CHEMICAL ETCHING; MICRO-FLUIDIC DEVICES; MORPHOLOGICAL PROPERTIES; SINGLE ETCH PROCESS; SUPER-HYDROPHILIC;

WETTING;

EID: 84868089518 PISSN: None EISSN: 20462069 Source Type: Journal
DOI: 10.1039/c2ra22267a Document Type: Article

Times cited : (32)

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