SCOPUS 정보 검색 플랫폼

Nanotechnology

Volumn 23, Issue 46, 2012, Pages

A novel nano-scale non-contact temperature measurement technique for crystalline materials

(2) Wu, Xiaowei a Hull, Robert a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT PROBES; CONTRAST MECHANISM; DIFFUSE SCATTERING; ELECTRON BACK SCATTER DIFFRACTION; ELEMENTAL MAPS; GRAIN ORIENTATION; NANO SCALE; NEW HIGH; NON-CONTACT; NONCONTACT METHODS; OPTICAL WAVELENGTH; SCANNING THERMAL MICROSCOPY; SPATIAL RESOLUTION; TEMPERATURE DEPENDENT; TEMPERATURE MAPPING; TEMPERATURE SIGNAL; TOPOGRAPHIC IMAGES;

CRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY;

TEMPERATURE MEASUREMENT;

EID: 84867946444 PISSN: 09574484 EISSN: 13616528 Source Type: Journal
DOI: 10.1088/0957-4484/23/46/465707 Document Type: Article

Times cited : (13)

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